中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Morphology and thermal stability of Ti-doped copper nitride films

文献类型:期刊论文

作者Fan XY(范晓彦) ; Wu ZG(吴志国) ; Li HJ(李华军) ; Geng BS(耿柏松) ; Li C(李春) ; Yan PX(阎鹏勋)
刊名JOURNAL OF PHYSICS D: APPLIED PHYSICS
出版日期2007
卷号40页码:3430-3435
ISSN号0022-3727
通讯作者阎鹏勋
中文摘要A weakly Ti-doped copper nitride (Cu3N) film was prepared by cylindrical magnetron sputtering. The XPS results indicate that Ti atoms do not substitute for the Cu atoms but probably locate at the grain boundaries. The columnar grains size is about half of that of the undoped Cu3N film and the surface is smoother. For weakly Ti-doped Cu3N films, a dense layer appears on top of the columnar crystals. The RMS of the Cu film formed by annealing of the weakly Ti-doped Cu3N film is more than twice larger than that of the film before annealing. Compared with the undoped Cu3N film, it possesses fine thermal stability both in vacuum and in atmosphere.
学科主题材料科学与物理化学
收录类别SCI
资助信息the Nature Science Foundation of Gansu Province, People’s Republic of China. The project number is ZS021-A25-022-C
语种英语
WOS记录号WOS:000246577500026
公开日期2013-11-01
源URL[http://210.77.64.217/handle/362003/4062]  
专题兰州化学物理研究所_固体润滑国家重点实验室
推荐引用方式
GB/T 7714
Fan XY,Wu ZG,Li HJ,et al. Morphology and thermal stability of Ti-doped copper nitride films[J]. JOURNAL OF PHYSICS D: APPLIED PHYSICS,2007,40:3430-3435.
APA 范晓彦,吴志国,李华军,耿柏松,李春,&阎鹏勋.(2007).Morphology and thermal stability of Ti-doped copper nitride films.JOURNAL OF PHYSICS D: APPLIED PHYSICS,40,3430-3435.
MLA 范晓彦,et al."Morphology and thermal stability of Ti-doped copper nitride films".JOURNAL OF PHYSICS D: APPLIED PHYSICS 40(2007):3430-3435.

入库方式: OAI收割

来源:兰州化学物理研究所

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