中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector

文献类型:期刊论文

作者Wu, TY; Li, SQ; Wang, W; Zhou, J; Yan, ZY; Hu, YM; Zhang, XX; Liang, ZJ; Wei, W; Zhang, Y
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
出版日期2024
卷号1059页码:168945
ISSN号0168-9002
DOI10.1016/j.nima.2023.168945
文献子类Article
电子版国际标准刊号1872-9576
WOS记录号WOS:001133568800001
源URL[https://ir.ihep.ac.cn/handle/311005/305427]  
专题高能物理研究所_实验物理中心
推荐引用方式
GB/T 7714
Wu, TY,Li, SQ,Wang, W,et al. Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,2024,1059:168945.
APA Wu, TY.,Li, SQ.,Wang, W.,Zhou, J.,Yan, ZY.,...&da Costa, JG.(2024).Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,1059,168945.
MLA Wu, TY,et al."Beam test of a 180 nm CMOS Pixel Sensor for the CEPC vertex detector".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 1059(2024):168945.

入库方式: OAI收割

来源:高能物理研究所

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