Measurement of Neutron-Induced Single-Event Upset Cross Section of UltraScale Kintex FPGA Using Time-of-Flight Technique
文献类型：期刊论文
| 作者 | Teng, Y; Feng, CQ; Tan, ZX; Liu, ZT; Qin, ZZ; Tang, SS; Fan, RR; Zhou, B; Hu, ZL; Zhao, L |
| 刊名 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE
 |
| 出版日期 | 2024 |
| 卷号 | 71期号:12页码:2545-2553 |
| ISSN号 | 0018-9499 |
| DOI | 10.1109/TNS.2024.3482881 |
| 文献子类 | Article |
| 电子版国际标准刊号 | 1558-1578 |
| WOS记录号 | WOS:001381812200011 |
| 源URL | [https://ir.ihep.ac.cn/handle/311005/305432]  |
| 专题 | 高能物理研究所_实验物理中心 |
| 推荐引用方式 GB/T 7714 | Teng, Y,Feng, CQ,Tan, ZX,et al. Measurement of Neutron-Induced Single-Event Upset Cross Section of UltraScale Kintex FPGA Using Time-of-Flight Technique[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2024,71(12):2545-2553. |
| APA | Teng, Y.,Feng, CQ.,Tan, ZX.,Liu, ZT.,Qin, ZZ.,...&Zou, C.(2024).Measurement of Neutron-Induced Single-Event Upset Cross Section of UltraScale Kintex FPGA Using Time-of-Flight Technique.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,71(12),2545-2553. |
| MLA | Teng, Y,et al."Measurement of Neutron-Induced Single-Event Upset Cross Section of UltraScale Kintex FPGA Using Time-of-Flight Technique".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 71.12(2024):2545-2553. |
入库方式： OAI收割
来源：高能物理研究所
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