Reliability studies of the custom-designed front-end and ADC chips used for JUNO large photomultipliers electronics
文献类型：期刊论文
| 作者 | Ye, Pei-ran; Yan, Xiong-bo; Ning, Zhe; Hu, Jun; Wei, Wei; Jiang, Xiao-shan; Jin, Ru-yi; Sun, Yun-hua; Hu, Qing-pei; Wang, Yu-sheng |
| 刊名 | Radiation Detection Technology and Methods
 |
| 出版日期 | 2024 |
| 卷号 | 8期号:2页码:1239-1245 |
| DOI | 10.1007/s41605-023-00440-x |
| 文献子类 | Article |
| 源URL | [https://ir.ihep.ac.cn/handle/311005/307317]  |
| 专题 | 高能物理研究所_实验物理中心 |
| 推荐引用方式 GB/T 7714 | Ye, Pei-ran,Yan, Xiong-bo,Ning, Zhe,et al. Reliability studies of the custom-designed front-end and ADC chips used for JUNO large photomultipliers electronics[J]. Radiation Detection Technology and Methods,2024,8(2):1239-1245. |
| APA | Ye, Pei-ran.,Yan, Xiong-bo.,Ning, Zhe.,Hu, Jun.,Wei, Wei.,...&Li, Mu-jin.(2024).Reliability studies of the custom-designed front-end and ADC chips used for JUNO large photomultipliers electronics.Radiation Detection Technology and Methods,8(2),1239-1245. |
| MLA | Ye, Pei-ran,et al."Reliability studies of the custom-designed front-end and ADC chips used for JUNO large photomultipliers electronics".Radiation Detection Technology and Methods 8.2(2024):1239-1245. |
入库方式： OAI收割
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。