中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study of the Behavior of Positronium Annihilation in Porous Silicon

文献类型:期刊论文

作者Wang, BY; Yu, RS; Cao, XZ; Li, ZX; Zhang, P; Qin, XB; Wei, L; Kurihara, T
刊名Materials Science Forum
出版日期2013
卷号733页码:203-206
关键词Positron annihilation Positronium Porous silicon
ISSN号0255-5476
DOI10.4028/www.scientific.net/MSF.733.203
文献子类Article
英文摘要The annihilation behavior of positronium in N and P type porous silicon is investigated via positron annihilation lifetime (PAL) and positronium time-of-flight (Ps-TOF) measurements. The result shows the N type sample has smaller positronium annihilation fraction and more interconnected pores. The microstructure of Rapid Thermal Oxidation (RTO) treated N type porous silicon also studied using PAL spectroscopy, and the relationship between its photoluminescence properties and porous structure was discussed. © (2013) Trans Tech Publications, Switzerland.
电子版国际标准刊号16629752
WOS关键词SPECTRA
WOS研究方向Materials Science ; Physics
语种英语
WOS记录号WOS:000315535700042
源URL[https://ir.ihep.ac.cn/handle/311005/304280]  
专题高能物理研究所_多学科研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Wang, BY,Yu, RS,Cao, XZ,et al. Study of the Behavior of Positronium Annihilation in Porous Silicon[J]. Materials Science Forum,2013,733:203-206.
APA Wang, BY.,Yu, RS.,Cao, XZ.,Li, ZX.,Zhang, P.,...&Kurihara, T.(2013).Study of the Behavior of Positronium Annihilation in Porous Silicon.Materials Science Forum,733,203-206.
MLA Wang, BY,et al."Study of the Behavior of Positronium Annihilation in Porous Silicon".Materials Science Forum 733(2013):203-206.

入库方式: OAI收割

来源:高能物理研究所

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