Automatic marker-based alignment method for a nano-resolution full-field transmission X-ray microscope
文献类型：期刊论文
| 作者 | Zhou, Chenpeng; Wang, Yan; Wang, Shanfeng; Zhang, Jin; Fu, Tianyu; Huang, Wanxia; Zhang, Kai; Yuan, Qingxi |
| 刊名 | APPLIED OPTICS
 |
| 出版日期 | 2023 |
| 卷号 | 62期号:36页码:9536-9543 |
| ISSN号 | 1559-128X |
| DOI | 10.1364/AO.506046 |
| 文献子类 | Journal article (JA) |
| 电子版国际标准刊号 | 2155-3165 |
| WOS记录号 | WOS:001147953300004 |
| 源URL | [https://ir.ihep.ac.cn/handle/311005/305142]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Zhou, Chenpeng,Wang, Yan,Wang, Shanfeng,et al. Automatic marker-based alignment method for a nano-resolution full-field transmission X-ray microscope[J]. APPLIED OPTICS,2023,62(36):9536-9543. |
| APA | Zhou, Chenpeng.,Wang, Yan.,Wang, Shanfeng.,Zhang, Jin.,Fu, Tianyu.,...&Yuan, Qingxi.(2023).Automatic marker-based alignment method for a nano-resolution full-field transmission X-ray microscope.APPLIED OPTICS,62(36),9536-9543. |
| MLA | Zhou, Chenpeng,et al."Automatic marker-based alignment method for a nano-resolution full-field transmission X-ray microscope".APPLIED OPTICS 62.36(2023):9536-9543. |
入库方式： OAI收割
来源：高能物理研究所
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