中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching

文献类型:期刊论文

作者Chen, Y; Li, SM; Shen, ZB; Sun, CL; Feng, JT; Ye, L
刊名SCIENCE CHINA-MATERIALS
出版日期2024
卷号67期号:12页码:3917-3924
ISSN号2095-8226
DOI10.1007/s40843-024-3121-2
文献子类Article
电子版国际标准刊号2199-4501
WOS记录号WOS:001347895900001
源URL[https://ir.ihep.ac.cn/handle/311005/305416]  
专题高能物理研究所_多学科研究中心
推荐引用方式
GB/T 7714
Chen, Y,Li, SM,Shen, ZB,et al. In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching[J]. SCIENCE CHINA-MATERIALS,2024,67(12):3917-3924.
APA Chen, Y,Li, SM,Shen, ZB,Sun, CL,Feng, JT,&Ye, L.(2024).In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching.SCIENCE CHINA-MATERIALS,67(12),3917-3924.
MLA Chen, Y,et al."In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching".SCIENCE CHINA-MATERIALS 67.12(2024):3917-3924.

入库方式: OAI收割

来源:高能物理研究所

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