Exploring crucial technological advancements in Anger-Camera neutron detectors for single crystal neutron diffraction
文献类型：期刊论文
| 作者 | Cai, XJ; Bin, T; Huang, C; Yu, Q; Xia, LS; Guo, DW; Wang, XH |
| 刊名 | RADIATION MEASUREMENTS
 |
| 出版日期 | 2024 |
| 卷号 | 175页码:107176 |
| ISSN号 | 1350-4487 |
| DOI | 10.1016/j.radmeas.2024.107176 |
| 文献子类 | Article |
| 电子版国际标准刊号 | 1879-0925 |
| WOS记录号 | WOS:001249699000001 |
| 源URL | [https://ir.ihep.ac.cn/handle/311005/305802]  |
| 专题 | 高能物理研究所_东莞分部 |
| 推荐引用方式 GB/T 7714 | Cai, XJ,Bin, T,Huang, C,et al. Exploring crucial technological advancements in Anger-Camera neutron detectors for single crystal neutron diffraction[J]. RADIATION MEASUREMENTS,2024,175:107176. |
| APA | Cai, XJ.,Bin, T.,Huang, C.,Yu, Q.,Xia, LS.,...&Wang, XH.(2024).Exploring crucial technological advancements in Anger-Camera neutron detectors for single crystal neutron diffraction.RADIATION MEASUREMENTS,175,107176. |
| MLA | Cai, XJ,et al."Exploring crucial technological advancements in Anger-Camera neutron detectors for single crystal neutron diffraction".RADIATION MEASUREMENTS 175(2024):107176. |
入库方式： OAI收割
来源：高能物理研究所
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