中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Preparation and measurement of an x-ray Laue-type monochromator based on a WSi2/Si multilayer

文献类型:期刊论文

作者Yue, SP; Hou, QY; Ji, B; Zhou, L; Li, M; Liu, P; Chang, GC
刊名APPLIED OPTICS
出版日期2024
卷号63期号:12页码:3260-3264
ISSN号1559-128X
DOI10.1364/AO.521033
文献子类Article
电子版国际标准刊号2155-3165
WOS记录号WOS:001230462200002
源URL[https://ir.ihep.ac.cn/handle/311005/306200]  
专题高能物理研究所_多学科研究中心
推荐引用方式
GB/T 7714
Yue, SP,Hou, QY,Ji, B,et al. Preparation and measurement of an x-ray Laue-type monochromator based on a WSi2/Si multilayer[J]. APPLIED OPTICS,2024,63(12):3260-3264.
APA Yue, SP.,Hou, QY.,Ji, B.,Zhou, L.,Li, M.,...&Chang, GC.(2024).Preparation and measurement of an x-ray Laue-type monochromator based on a WSi2/Si multilayer.APPLIED OPTICS,63(12),3260-3264.
MLA Yue, SP,et al."Preparation and measurement of an x-ray Laue-type monochromator based on a WSi2/Si multilayer".APPLIED OPTICS 63.12(2024):3260-3264.

入库方式: OAI收割

来源:高能物理研究所

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