中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Development of a high-precision long trace profiler utilizing shear measurements

文献类型:期刊论文

作者Cui, Xiaowen; Wu, Ming; Dong, Han; Qin, Xiaobo; Yang, Fugui; Zhang, Xiaowei; Li, Ming; Sheng, Weifan
刊名REVIEW OF SCIENTIFIC INSTRUMENTS
出版日期2024
卷号95期号:10页码:105109
ISSN号0034-6748
DOI10.1063/5.0230952
文献子类Article
电子版国际标准刊号1089-7623
WOS记录号WOS:001335414100002
源URL[https://ir.ihep.ac.cn/handle/311005/306634]  
专题高能物理研究所_多学科研究中心
推荐引用方式
GB/T 7714
Cui, Xiaowen,Wu, Ming,Dong, Han,et al. Development of a high-precision long trace profiler utilizing shear measurements[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2024,95(10):105109.
APA Cui, Xiaowen.,Wu, Ming.,Dong, Han.,Qin, Xiaobo.,Yang, Fugui.,...&Sheng, Weifan.(2024).Development of a high-precision long trace profiler utilizing shear measurements.REVIEW OF SCIENTIFIC INSTRUMENTS,95(10),105109.
MLA Cui, Xiaowen,et al."Development of a high-precision long trace profiler utilizing shear measurements".REVIEW OF SCIENTIFIC INSTRUMENTS 95.10(2024):105109.

入库方式: OAI收割

来源:高能物理研究所

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