Absolute intensity calibration of samples at variable sample to detector distances in small angle X-ray scattering (SAXS)
文献类型：期刊论文
| 作者 | Fan, Yueqian; Chen, Rongchao; Shang, Xiaoxia; Wu, Haijuan; Yang, Chunming; Fan, Huiling; Li, Zhihong; Chen, Jiangang; Li, Dongfeng |
| 刊名 | INSTRUMENTATION SCIENCE & TECHNOLOGY
 |
| 出版日期 | 2024 |
| 卷号 | 52期号:6页码:702-710 |
| ISSN号 | 1073-9149 |
| DOI | 10.1080/10739149.2024.2322721 |
| 文献子类 | Article |
| 电子版国际标准刊号 | 1525-6030 |
| WOS记录号 | WOS:001176270700001 |
| 源URL | [https://ir.ihep.ac.cn/handle/311005/307039]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Fan, Yueqian,Chen, Rongchao,Shang, Xiaoxia,et al. Absolute intensity calibration of samples at variable sample to detector distances in small angle X-ray scattering (SAXS)[J]. INSTRUMENTATION SCIENCE & TECHNOLOGY,2024,52(6):702-710. |
| APA | Fan, Yueqian.,Chen, Rongchao.,Shang, Xiaoxia.,Wu, Haijuan.,Yang, Chunming.,...&Li, Dongfeng.(2024).Absolute intensity calibration of samples at variable sample to detector distances in small angle X-ray scattering (SAXS).INSTRUMENTATION SCIENCE & TECHNOLOGY,52(6),702-710. |
| MLA | Fan, Yueqian,et al."Absolute intensity calibration of samples at variable sample to detector distances in small angle X-ray scattering (SAXS)".INSTRUMENTATION SCIENCE & TECHNOLOGY 52.6(2024):702-710. |
入库方式： OAI收割
来源：高能物理研究所
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