Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements
文献类型：期刊论文
| 作者 | Liu, Fang; Li, Ming; Diao, Qianshun; Li, Zhe; Shen, Zhibang; Li, Fan; Hong, Zhen; Lian, Hongkai; Yue, Shuaipeng; Hou, Qingyan |
| 刊名 | JOURNAL OF SYNCHROTRON RADIATION
 |
| 出版日期 | 2024 |
| 卷号 | 31期号:Pt 5页码:1146-1153 |
| ISSN号 | 0909-0495 |
| DOI | 10.1107/S1600577524006222 |
| 文献子类 | Article |
| 电子版国际标准刊号 | 1600-5775 |
| WOS记录号 | WOS:001362324700017 |
| 源URL | [https://ir.ihep.ac.cn/handle/311005/307367]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 推荐引用方式 GB/T 7714 | Liu, Fang,Li, Ming,Diao, Qianshun,et al. Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements[J]. JOURNAL OF SYNCHROTRON RADIATION,2024,31(Pt 5):1146-1153. |
| APA | Liu, Fang.,Li, Ming.,Diao, Qianshun.,Li, Zhe.,Shen, Zhibang.,...&Yang, Junliang.(2024).Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.JOURNAL OF SYNCHROTRON RADIATION,31(Pt 5),1146-1153. |
| MLA | Liu, Fang,et al."Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements".JOURNAL OF SYNCHROTRON RADIATION 31.Pt 5(2024):1146-1153. |
入库方式： OAI收割
来源：高能物理研究所
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