中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Edge Electronic States andDirect Bandgap inSi Nanostructures onSilicon Oxide

文献类型:期刊论文

作者Zhong-Mei Huang; Xi Zhang; Yin-lian Li; Wei-Qi Huang; Hao-Ze Wang; Yu Yang; Anchen Wang; Shi-Rong Liu
刊名Transactions on Electrical and Electronic Materials
出版日期2024
卷号25期号:3页码:340-346
关键词Edge States, Si Nanostructures, Silicon Oxide, emisSion, Energy Band, Dirac Relation
DOI10.1007/s42341-024-00516-5
英文摘要

The nanostructures on silicon oxide, as a new phase of matter, only allows conducting electrons to exist on its surfaces, in which the edge electronic states dramatically provide intriguing insights into the world of low-dimensional quantum systems featuring and proposing the mechanisms of optical mode formation. We report that the formations of a nanolayer and a nanodisk structure on silicon oxide have been produced by using a novel preparation methodology, mainly involving the pulsed laser deposition in oxygen environment and the coherent electron beam irradiation process. Here, the structures of the Si nanolayer and the nanodisk on silicon oxide have been observed in the TEM images. The electronic edge states in the Si nanostructures on silicon oxide for emission were demonstrated in photoluminescence measurement. The simulation model of the Si nanostructures on silicon oxide has been built according the experimental results. And the results of the simulating calculation demonstrated that the Dirac relation is competition with the quantum confinement effect in the geometry change of the Si nanostructures on silicon oxide, in which the transforming edge states into direct bandgap can be realized for better emission.

语种英语
源URL  
专题地球化学研究所_矿床地球化学国家重点实验室
作者单位1.College of Materials and Metallurgy, Institute of Nanophotonic Physics, Guizhou University, Guiyang, 550025, China
2.State Key Laboratory of Surface Physics, Department of Physics, Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education), Fudan University, Shanghai, 200433, China
3.College of Materials and Energy, Yunnan University, Kunming, 650504, China
4.State Key Laboratory of Environment Geochemistry, Institute of Geochemistry, Chinese Academy of Sciences, Guiyang, 550003, China
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Zhong-Mei Huang,Xi Zhang,Yin-lian Li,et al. Edge Electronic States andDirect Bandgap inSi Nanostructures onSilicon Oxide[J]. Transactions on Electrical and Electronic Materials,2024,25(3):340-346.
APA Zhong-Mei Huang.,Xi Zhang.,Yin-lian Li.,Wei-Qi Huang.,Hao-Ze Wang.,...&Shi-Rong Liu.(2024).Edge Electronic States andDirect Bandgap inSi Nanostructures onSilicon Oxide.Transactions on Electrical and Electronic Materials,25(3),340-346.
MLA Zhong-Mei Huang,et al."Edge Electronic States andDirect Bandgap inSi Nanostructures onSilicon Oxide".Transactions on Electrical and Electronic Materials 25.3(2024):340-346.

入库方式: OAI收割

来源:地球化学研究所

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