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Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM

文献类型：期刊论文

作者Hu, Z. C.2; Wei, X. X.3; Zhang, B.3; Xu, D. K.4,5; Zhang, G. T.2; Tang, K.2; Ma, X. L.3
刊名JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
出版日期2025-03-01
卷号210页码:278-283
ISSN号1005-0302
DOI10.1016/j.jmst.2023.10.066
通讯作者Zhang, B.(bozhang@sslab.org.cn) ; Xu, D. K.(xudake@mail.neu.edu.cn) ; Ma, X. L.(xlma@sslab.org.cn)
资助项目National Natural Science Foun-dation of China[52371071] ; National Natural Science Foun-dation of China[51971228] ; National Natural Science Foun-dation of China[51771212]
WOS研究方向Materials Science ; Metallurgy & Metallurgical Engineering
语种英语
WOS记录号WOS:001364269800001
出版者ELSEVIER
资助机构National Natural Science Foun-dation of China
源URL  
专题金属研究所_中国科学院金属研究所
通讯作者Zhang, B.; Xu, D. K.; Ma, X. L.
作者单位1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
2.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China
3.Songshan Lake Mat Lab, Bay Area Ctr Electron Microscopy, Dongguan 523808, Peoples R China
4.Northeastern Univ, Shenyang Natl Lab Mat Sci, Shenyang 110819, Peoples R China
5.Northeastern Univ, Sch Mat Sci & Engn, Key Lab Anisotropy & Texture Mat, Minist Educ, Shenyang 110819, Peoples R China
推荐引用方式
GB/T 7714		 Hu, Z. C.,Wei, X. X.,Zhang, B.,et al. Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2025,210:278-283.
APA Hu, Z. C..,Wei, X. X..,Zhang, B..,Xu, D. K..,Zhang, G. T..,...&Ma, X. L..(2025).Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,210,278-283.
MLA Hu, Z. C.,et al."Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 210(2025):278-283.

入库方式： OAI收割

来源：金属研究所

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