中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Guest Editorial 2.5D/3D Chiplet Circuits and Systems, EDA, Advanced Packaging, and Test-Part I

文献类型:期刊论文

作者Hao, Qinfen1; Chen, Kuan-Neng2; Goel, Sandeep Kumar3; Li, Hai4; Marinissen, Erik Jan5
刊名IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS
出版日期2025-09-01
卷号15期号:3页码:362-367
关键词Special issues and sections Chiplets Circuits and systems Electronic design automation and methodology Packaging
ISSN号2156-3357
DOI10.1109/JETCAS.2025.3600772
WOS研究方向Engineering
语种英语
WOS记录号WOS:001576681500008
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://119.78.100.204/handle/2XEOYT63/41698]  
专题中国科学院计算技术研究所期刊论文_英文
通讯作者Hao, Qinfen
作者单位1.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China
2.Natl Yang Ming Chiao Tung Univ, Inst Elect, Hsinchu 30010, Taiwan
3.Taiwan Semicond Mfg Co TSMC, San Jose, CA 95124 USA
4.Duke Univ, Elect & Comp Engn Dept, Durham, NC 27708 USA
5.imec, B-3001 Leuven, Belgium
推荐引用方式
GB/T 7714
Hao, Qinfen,Chen, Kuan-Neng,Goel, Sandeep Kumar,et al. Guest Editorial 2.5D/3D Chiplet Circuits and Systems, EDA, Advanced Packaging, and Test-Part I[J]. IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS,2025,15(3):362-367.
APA Hao, Qinfen,Chen, Kuan-Neng,Goel, Sandeep Kumar,Li, Hai,&Marinissen, Erik Jan.(2025).Guest Editorial 2.5D/3D Chiplet Circuits and Systems, EDA, Advanced Packaging, and Test-Part I.IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS,15(3),362-367.
MLA Hao, Qinfen,et al."Guest Editorial 2.5D/3D Chiplet Circuits and Systems, EDA, Advanced Packaging, and Test-Part I".IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS 15.3(2025):362-367.

入库方式: OAI收割

来源:计算技术研究所

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