effect of alumina interlayers on the microstructure and optical properties of ag films deposited on glasses
文献类型：会议论文
| 作者 | Sun XL(孙喜莲) ; Fan ZX(范正修) ; Shao JD(邵建达) |
| 出版日期 | 2007 |
| 会议名称 | 第六届中国国际纳米科技研讨会 |
| 会议地点 | 成都 |
| 关键词 | Ag film Al2O3 interlayer microstructure optical properties |
| 中文摘要 | Optical properties and microstructure of Ag films with Al2O3 interlayer of different thickness on glass substrates were investigated by using spectrophotometer and XRD. The spectra results showed that the reflectivity of Ag films increased with the thickness of Al2O3 interlayer increasing from 9 nm to 24 nm and then decreased with increasing Al2O3 film thickness to 24 nm. Compared with pure Ag film on glass substrate, the reflectivity of Ag films with the Al2O3 interlayer of 24 nm was higher and that of Ag films with 9-18 nm and 30-36 nm Al2O3 interlayer was lower. Thus, the reflectivity of Ag film can be promoted by introducing a certain thickness of Al2O3 interlayer. The XRD analysis showed that with a certain thickness of Al2O3 interlayer, the crystalline grains increased, scattering decreased, and the strain increased. |
| 收录类别 | 其它 |
| 会议主办者 | 中国微米纳米技术学会 |
| 会议录 | 第六届中国国际纳米科技研讨会论文集
 |
| 语种 | 中文 |
| 源URL | [http://ir.nimte.ac.cn/handle/174433/1362]  |
| 专题 | 宁波材料技术与工程研究所_宁波所知识产出 |
| 推荐引用方式 GB/T 7714 | Sun XL,Fan ZX,Shao JD. effect of alumina interlayers on the microstructure and optical properties of ag films deposited on glasses[C]. 见:第六届中国国际纳米科技研讨会. 成都. |
入库方式： OAI收割
来源：宁波材料技术与工程研究所
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