中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
In-Plane-Gate Transparent SnO2 Nanowire Transistors

文献类型:期刊论文

作者Wan Q(万青) ; Huixuan Liu and Qing Wan
刊名IEEE ELECTRON DEVICE LETTERS
出版日期2012-10-02
期号11页码:1625—1627
通讯作者万青
合作状况李雨桐
中文摘要In-plane-gate transparent SnO2 nanowire transistors gated by SnO2-based solid electrolytes are fabricated on glass substrate at room temperature. Low-voltage (1.0 V) operation of such device is realized due to the large electric-double-layer capacitance of 0.75 μF/cm2 at 20 Hz. The subthreshold slope, current on/off ratio, and field-effect mobility of the in-plane-gate transparent nanowire transistors are estimated to be 92 mV/decade,> 105, and 106.8 cm2/V · s, respectively. Such low-voltage in-plane-gate transparent nanowire transistors are promising for portable invisible sensors.
学科主题物理化学
原文出处SCI收录
公开日期2013-12-16
源URL[http://ir.nimte.ac.cn/handle/174433/9712]  
专题宁波材料技术与工程研究所_宁波所知识产出
推荐引用方式
GB/T 7714
Wan Q,Huixuan Liu and Qing Wan. In-Plane-Gate Transparent SnO2 Nanowire Transistors[J]. IEEE ELECTRON DEVICE LETTERS,2012(11):1625—1627.
APA Wan Q,&Huixuan Liu and Qing Wan.(2012).In-Plane-Gate Transparent SnO2 Nanowire Transistors.IEEE ELECTRON DEVICE LETTERS(11),1625—1627.
MLA Wan Q,et al."In-Plane-Gate Transparent SnO2 Nanowire Transistors".IEEE ELECTRON DEVICE LETTERS .11(2012):1625—1627.

入库方式: OAI收割

来源:宁波材料技术与工程研究所

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