中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A Double-Gate AlGaN/GaN HEMT With Improved Dynamic Performance

文献类型:期刊论文

作者Cai, Y(蔡勇); Zhao, DS(赵德胜); Qin, H(秦华); Zhang, BS(张宝顺); Zeng, CH(曾春红)
刊名IEEE ELECTRON DEVICE LETTERS
出版日期2013-06
卷号34期号:6页码:747-749
关键词AlGaN/GaN high electron mobility transistor (HEMT) dynamic performance power device
通讯作者Yu, GH(于国浩)
英文摘要In this letter, a double-gate AlGaN/GaN high electron mobility transistor operated in a synchronized switching mode is demonstrated, and improved dynamic performances are obtained. The additional gate sits on top of the conventional gate and stretches 2/4 mu m to the source/drain electrodes, respectively. A positive voltage pulse is applied to the top gate and is synchronized with the ON-OFF switching pulse applied to the conventional gate. Such a double-gate driving method significantly improves the dynamic performances of the device. Moreover, it allows us to investigate the dynamic ON-resistance in the drift region in detail.
收录类别SCI ; EI
语种英语
WOS记录号WOS:000319460800010
公开日期2013-12-30
源URL[http://ir.sinano.ac.cn/handle/332007/1175]  
专题苏州纳米技术与纳米仿生研究所_纳米加工公共平台
推荐引用方式
GB/T 7714
Cai, Y,Zhao, DS,Qin, H,et al. A Double-Gate AlGaN/GaN HEMT With Improved Dynamic Performance[J]. IEEE ELECTRON DEVICE LETTERS,2013,34(6):747-749.
APA Cai, Y,Zhao, DS,Qin, H,Zhang, BS,&Zeng, CH.(2013).A Double-Gate AlGaN/GaN HEMT With Improved Dynamic Performance.IEEE ELECTRON DEVICE LETTERS,34(6),747-749.
MLA Cai, Y,et al."A Double-Gate AlGaN/GaN HEMT With Improved Dynamic Performance".IEEE ELECTRON DEVICE LETTERS 34.6(2013):747-749.

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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