Electrical and optical inhomogeneity in N-face GaN grown by hydride vapor phase epitaxy
文献类型:期刊论文
作者 | Ren, GQ(任国强)![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() |
刊名 | JOURNAL OF CRYSTAL GROWTH
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出版日期 | 2013-06-01 |
卷号 | 372期号:0页码:43-48 |
关键词 | Defects Etching Hydride vapor phase epitaxy Nitrides |
通讯作者 | Xu, K(徐科) |
英文摘要 | A detailed study on electrical and optical inhomogeneity in N-face GaN grown by hydride vapor phase epitaxy is presented. There are two distinctive regions with non-homogeneous electrical and optical properties in N-face of GaN revealed by wet etching, Raman and cathodoluminescence. One region exclusively exhibited stronger donor–acceptor pair emission and higher carrier concentration due to impurity incorporation. A strong red-shift of near band edge emission of ∼24 meV was also observed owing to additional carrier concentration. Furthermore, the activation energy difference of the etching process between the two regions is ∼0.12 eV. The distinctive etching topography was probably due to the difference of surface potentials related to the level of carrier concentration in GaN. |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000319052400007 |
公开日期 | 2014-01-12 |
源URL | [http://ir.sinano.ac.cn/handle/332007/1280] ![]() |
专题 | 苏州纳米技术与纳米仿生研究所_测试分析平台 |
通讯作者 | Xu, K(徐科) |
推荐引用方式 GB/T 7714 | Ren, GQ,Xu, K,Su, XJ,et al. Electrical and optical inhomogeneity in N-face GaN grown by hydride vapor phase epitaxy[J]. JOURNAL OF CRYSTAL GROWTH,2013,372(0):43-48. |
APA | Ren, GQ.,Xu, K.,Su, XJ.,Yang, H.,Zhou, TF.,...&Zeng, XH.(2013).Electrical and optical inhomogeneity in N-face GaN grown by hydride vapor phase epitaxy.JOURNAL OF CRYSTAL GROWTH,372(0),43-48. |
MLA | Ren, GQ,et al."Electrical and optical inhomogeneity in N-face GaN grown by hydride vapor phase epitaxy".JOURNAL OF CRYSTAL GROWTH 372.0(2013):43-48. |
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