The Influence of CeO2 Nano-Dots Decoration on Substrates on Flux Pinning Strength in Tl2Ba2CaCu2O8 Thin Films
文献类型：期刊论文
| 作者 | Ji, Lu1; Gao, Xiaoxin1; Ge, Deyong1; Xie, Wei1; Wang, Pei1; Zhao, Xinjie1; Wang, Zheng2 ; He, Ming1; Zhang, Xu1; Li, Wei3
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| 刊名 | IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
 |
| 出版日期 | 2013-06-01 |
| 卷号 | 23期号:3页码:6384687-6384687 |
| 关键词 | CeO2 pinning center Tl-2212 |
| ISSN号 | 1051-8223 |
| 通讯作者 | Ji, Lu |
| 英文摘要 | Nano-sized CeO2 dots were deposited on (001) LaAlO3 substrate by rf magnetron sputtering. After the processing of the artificial decoration defects on the substrate, 100-nm, 150-nm, 200-nm, and 400-nm-thick Tl2Ba2CaCu2O8 (Tl-2212) thin films were grown on it, using dc magnetron sputtering and post annealing process. AFM images showed that the CeO2 nanodots were distributed well on the substrate surface with 70 nm in diameter and 5 nm in height, and the density of nano-dots was 25 +/- 3 dots/mu m(2). SEM images were used to observe the variations on film surface. Transport critical current density J(c) was measured both on Tl-2212 film with nano-dots decorated substrate and untreated single crystal LaAlO3 substrate. From the results, J(c) values of Tl-2212 films with nano-dots decorated substrate were lifted significantly, and the pinning strength was improved on Tl-2212 films by nanostructure defects induced from nano-dots. |
| WOS标题词 | Science & Technology ; Technology ; Physical Sciences |
| 学科主题 | Engineering ; Physics |
| 类目[WOS] | Engineering, Electrical & Electronic ; Physics, Applied |
| 研究领域[WOS] | Engineering ; Physics |
| 关键词[WOS] | MICROWAVE SURFACE-RESISTANCE ; TEMPERATURE ; CONDUCTORS ; CENTERS ; TL-2212 ; FILTERS |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000318997100072 |
| 公开日期 | 2014-01-08 |
| 源URL | [http://libir.pmo.ac.cn/handle/332002/9801]  |
| 专题 | 紫金山天文台_毫米波和亚毫米波技术实验室 |
| 作者单位 | 1.Nankai Univ, Dept Elect, Tianjin 300071, Peoples R China 2.Chinese Acad Sci, Purple Mt Observ, Nanjing 210008, Jiangsu, Peoples R China 3.Nankai Univ, Coll Phys, Tianjin 300071, Peoples R China |
| 推荐引用方式 GB/T 7714 | Ji, Lu,Gao, Xiaoxin,Ge, Deyong,et al. The Influence of CeO2 Nano-Dots Decoration on Substrates on Flux Pinning Strength in Tl2Ba2CaCu2O8 Thin Films[J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,2013,23(3):6384687-6384687. |
| APA | Ji, Lu.,Gao, Xiaoxin.,Ge, Deyong.,Xie, Wei.,Wang, Pei.,...&Yan, Shaolin.(2013).The Influence of CeO2 Nano-Dots Decoration on Substrates on Flux Pinning Strength in Tl2Ba2CaCu2O8 Thin Films.IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,23(3),6384687-6384687. |
| MLA | Ji, Lu,et al."The Influence of CeO2 Nano-Dots Decoration on Substrates on Flux Pinning Strength in Tl2Ba2CaCu2O8 Thin Films".IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY 23.3(2013):6384687-6384687. |
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来源：紫金山天文台
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