4.2K low temperature scanning tunneling microscope and its application to the observation of charge density wave in 2H-NbSe2
文献类型：期刊论文
| 作者 | H.J. Tao ; H.T. Yang ; D. Liu ; L.H. Zhang ; Z.X. Zhao |
| 刊名 | J. of Chinese Electron Microscopy Society
 |
| 出版日期 | 1999 |
| 卷号 | 18页码:84 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/32779]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | H.J. Tao,H.T. Yang,D. Liu,et al. 4.2K low temperature scanning tunneling microscope and its application to the observation of charge density wave in 2H-NbSe2[J]. J. of Chinese Electron Microscopy Society,1999,18:84. |
| APA | H.J. Tao,H.T. Yang,D. Liu,L.H. Zhang,&Z.X. Zhao.(1999).4.2K low temperature scanning tunneling microscope and its application to the observation of charge density wave in 2H-NbSe2.J. of Chinese Electron Microscopy Society,18,84. |
| MLA | H.J. Tao,et al."4.2K low temperature scanning tunneling microscope and its application to the observation of charge density wave in 2H-NbSe2".J. of Chinese Electron Microscopy Society 18(1999):84. |
入库方式： OAI收割
来源：物理研究所
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