A COMBINED REM AND WTEM STUDY OF GAAS ALXGA1-XAS MULTILAYER STRUCTURES
文献类型：期刊论文
| 作者 | PENG, LM ; DU, AY ; JIANG, J ; ZHOU, XC |
| 刊名 | PHILOSOPHICAL MAGAZINE LETTERS
 |
| 出版日期 | 1991 |
| 卷号 | 64期号:5页码:261 |
| 关键词 | REFLECTION ELECTRON-MICROSCOPY DIFFRACTION CONTRAST SURFACE STEPS DISLOCATION IMAGE |
| ISSN号 | 0950-0839 |
| 通讯作者 | PENG, LM: CHINESE ACAD SCI,BEIJING LAB ELECTRON MICROSCOPY,POB 2724,BEIJING,PEOPLES R CHINA. |
| 中文摘要 | The technique of reflection electron microscopy (REM) has been combined with wedge transmission electron microscopy (WTEM) in a single instrument using a single wedge-shaped specimen. This combination needs only a commercial transmission electron microscope (CTEM) with a double tilt (or less preferably a single tilt) specimen stage which allows a minimum 25-degrees rotation about one principal axis. Additional specimen preparation for WTEM and instrumental modifications to a CTEM are not required. We have demonstrated that, using a single wedge-shaped GaAs/AlxGa1-xAs specimen, much useful information can be obtained by combining the complementary information provided by REM and WTEM. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/32852]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | PENG, LM,DU, AY,JIANG, J,et al. A COMBINED REM AND WTEM STUDY OF GAAS ALXGA1-XAS MULTILAYER STRUCTURES[J]. PHILOSOPHICAL MAGAZINE LETTERS,1991,64(5):261. |
| APA | PENG, LM,DU, AY,JIANG, J,&ZHOU, XC.(1991).A COMBINED REM AND WTEM STUDY OF GAAS ALXGA1-XAS MULTILAYER STRUCTURES.PHILOSOPHICAL MAGAZINE LETTERS,64(5),261. |
| MLA | PENG, LM,et al."A COMBINED REM AND WTEM STUDY OF GAAS ALXGA1-XAS MULTILAYER STRUCTURES".PHILOSOPHICAL MAGAZINE LETTERS 64.5(1991):261. |
入库方式： OAI收割
来源：物理研究所
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