中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A comparative study on microstructures of beta-FeSi2 and carbon-doped beta-Fe(Si,C)(2) films by transmission electron microscopy

文献类型:期刊论文

作者Li, XN ; Nie, D ; Dong, C
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
出版日期2002
卷号194期号:1页码:47
关键词ION-BEAM SYNTHESIS SEMICONDUCTING FESI2 THIN-FILMS DISILICIDE DEPOSITION
ISSN号0168-583X
通讯作者Dong, C: Dalian Univ Technol, Dept Mat Engn, State Key Lab Mat Modificat Laser Ion & Electron, Dalian 116024, Peoples R China.
中文摘要The microstructures of beta-FeSi2 and carbon-doped beta-Fe(C,Si)(2) films, synthesized on Si substrates by metal vapor vacuum arc ion source ion implantor, are studied by transmission electron microscopy. Structure evolution at different annealing temperatures shows that, in comparison with undoped films, the C-doped film quality is improved as manifested by smooth beta/Si interface, homogeneous film thickness, fine grains, and high thermal stability. When the energy and dosage are 60 KV and 4 x 10(17) ions/cm(2), amorphous layer is formed directly, which transforms into homogeneous and smooth beta-FeSi2 surface films after crystallization. (C) 2002 Elsevier Science B.V. All rights reserved.
收录类别SCI
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/32861]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
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GB/T 7714
Li, XN,Nie, D,Dong, C. A comparative study on microstructures of beta-FeSi2 and carbon-doped beta-Fe(Si,C)(2) films by transmission electron microscopy[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2002,194(1):47.
APA Li, XN,Nie, D,&Dong, C.(2002).A comparative study on microstructures of beta-FeSi2 and carbon-doped beta-Fe(Si,C)(2) films by transmission electron microscopy.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,194(1),47.
MLA Li, XN,et al."A comparative study on microstructures of beta-FeSi2 and carbon-doped beta-Fe(Si,C)(2) films by transmission electron microscopy".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 194.1(2002):47.

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来源:物理研究所

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