A NEW SCHEME FOR X-RAY GRAZING-INCIDENCE DIFFRACTION
文献类型：期刊论文
| 作者 | CUI, SF ; MAI, ZH ; WU, LS ; WANG, CY ; DAI, DY |
| 刊名 | REVIEW OF SCIENTIFIC INSTRUMENTS
 |
| 出版日期 | 1991 |
| 卷号 | 62期号:10页码:2419 |
| 关键词 | SPECULAR REFLECTION CONDITIONS BRAGG-DIFFRACTION CRYSTALS SUPERLATTICES INTERFACE PROFILES |
| ISSN号 | 0034-6748 |
| 通讯作者 | CUI, SF: CHINESE ACAD SCI,INST PHYS,BEIJING 100080,PEOPLES R CHINA. |
| 中文摘要 | A new scheme for x-ray grazing incidence diffraction (GID) under total external reflection conditions is presented. This simple scheme allows the grazing angles and the scattering angles to be adjusted independently so that the structural and/or the chemical profiles of materials can be determined at controlled depths. As an example, Si1-xGex/Si superlattice materials were studied. Both commensurate and incommensurate growths between the two quantum wells in the strained-layer superlattice were observed by the GID technique. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/33097]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | CUI, SF,MAI, ZH,WU, LS,et al. A NEW SCHEME FOR X-RAY GRAZING-INCIDENCE DIFFRACTION[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,1991,62(10):2419. |
| APA | CUI, SF,MAI, ZH,WU, LS,WANG, CY,&DAI, DY.(1991).A NEW SCHEME FOR X-RAY GRAZING-INCIDENCE DIFFRACTION.REVIEW OF SCIENTIFIC INSTRUMENTS,62(10),2419. |
| MLA | CUI, SF,et al."A NEW SCHEME FOR X-RAY GRAZING-INCIDENCE DIFFRACTION".REVIEW OF SCIENTIFIC INSTRUMENTS 62.10(1991):2419. |
入库方式： OAI收割
来源：物理研究所
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