A simple model for electron temperature and penetration depth in interaction of ultra-short laser pulses with solid targets
文献类型:期刊论文
作者 | Zhang, Y ; Zhang, J ; Pan, SH ; Nie, YX |
刊名 | JOURNAL OF PHYSICS D-APPLIED PHYSICS
![]() |
出版日期 | 1997 |
卷号 | 30期号:4页码:655 |
关键词 | FOKKER-PLANCK SIMULATIONS X-RAY SOURCES PLASMA INTERACTIONS HEAT-TRANSPORT ABSORPTION GENERATION GRADIENTS |
ISSN号 | 0022-3727 |
通讯作者 | Zhang, Y: CHINESE ACAD SCI,INST PHYS,POB 603,BEIJING 100080,PEOPLES R CHINA. |
中文摘要 | A simple model of plasma heating and electron thermal conduction is proposed to estimate the temporal development of the electron temperature of the plasma during interaction of ultra-short laser pulses with solid targets. Our calculations show that the peak temperature is 894 eV and the penetration depth is about 70 nm for an Al target irradiated by an intense (I approximate to 10(16) W cm(-2)) laser pulse (150 fs) for a flux limiter (f) over bar = 0.1. The calculation indicates that the electron thermal conduction does play a major role and that the effect of the energy loss from electron-ion collisions is much less than that of the electron thermal conduction. Our modelling neglecting hydrodynamic expansion agrees well with experiments and with models that include expansion. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-17 |
源URL | [http://ir.iphy.ac.cn/handle/311004/33227] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Zhang, Y,Zhang, J,Pan, SH,et al. A simple model for electron temperature and penetration depth in interaction of ultra-short laser pulses with solid targets[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,1997,30(4):655. |
APA | Zhang, Y,Zhang, J,Pan, SH,&Nie, YX.(1997).A simple model for electron temperature and penetration depth in interaction of ultra-short laser pulses with solid targets.JOURNAL OF PHYSICS D-APPLIED PHYSICS,30(4),655. |
MLA | Zhang, Y,et al."A simple model for electron temperature and penetration depth in interaction of ultra-short laser pulses with solid targets".JOURNAL OF PHYSICS D-APPLIED PHYSICS 30.4(1997):655. |
入库方式: OAI收割
来源:物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。