中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy

文献类型:期刊论文

作者Chen, P ; Xu, SY ; Lin, J ; Ong, CK ; Cui, DF
刊名APPLIED SURFACE SCIENCE
出版日期1999
卷号137期号:1-4页码:98
关键词FERROELECTRIC PROPERTIES ELECTRODE
ISSN号0169-4332
通讯作者Chen, P: Natl Univ Singapore, Dept Phys, Kent Ridge, Singapore 119260, Singapore.
中文摘要The LaNiO3 thin film was grown on SrTiO3 (001) substrate by computer-controlled laser molecular beam epitaxy (laser MBE). In situ monitoring of the growing film surface was performed with a reflection high energy electron diffraction (RHEED). Angle-resolved X-ray photoelectron spectroscopy (ARXPS) indicated that the terminating plane of the LaNiO3 film was the LaO atomic plane, and the SrTiO3 (001) surfaces of as-supplied substrate as well as HF-pretreated substrate were predominantly terminated with TiO atomic plane. The structural conversion of the topmost atomic layer from NiO to LaO occurred during the LaNiO3 epitaxial growth process. (C) 1999 Elsevier Science B.V. All rights reserved.
收录类别SCI
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/33748]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Chen, P,Xu, SY,Lin, J,et al. Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy[J]. APPLIED SURFACE SCIENCE,1999,137(1-4):98.
APA Chen, P,Xu, SY,Lin, J,Ong, CK,&Cui, DF.(1999).Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy.APPLIED SURFACE SCIENCE,137(1-4),98.
MLA Chen, P,et al."Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy".APPLIED SURFACE SCIENCE 137.1-4(1999):98.

入库方式: OAI收割

来源:物理研究所

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