Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy
文献类型：期刊论文
| 作者 | Chen, P ; Xu, SY ; Lin, J ; Ong, CK ; Cui, DF |
| 刊名 | APPLIED SURFACE SCIENCE
 |
| 出版日期 | 1999 |
| 卷号 | 137期号:1-4页码:98 |
| 关键词 | FERROELECTRIC PROPERTIES ELECTRODE |
| ISSN号 | 0169-4332 |
| 通讯作者 | Chen, P: Natl Univ Singapore, Dept Phys, Kent Ridge, Singapore 119260, Singapore. |
| 中文摘要 | The LaNiO3 thin film was grown on SrTiO3 (001) substrate by computer-controlled laser molecular beam epitaxy (laser MBE). In situ monitoring of the growing film surface was performed with a reflection high energy electron diffraction (RHEED). Angle-resolved X-ray photoelectron spectroscopy (ARXPS) indicated that the terminating plane of the LaNiO3 film was the LaO atomic plane, and the SrTiO3 (001) surfaces of as-supplied substrate as well as HF-pretreated substrate were predominantly terminated with TiO atomic plane. The structural conversion of the topmost atomic layer from NiO to LaO occurred during the LaNiO3 epitaxial growth process. (C) 1999 Elsevier Science B.V. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/33748]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Chen, P,Xu, SY,Lin, J,et al. Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy[J]. APPLIED SURFACE SCIENCE,1999,137(1-4):98. |
| APA | Chen, P,Xu, SY,Lin, J,Ong, CK,&Cui, DF.(1999).Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy.APPLIED SURFACE SCIENCE,137(1-4),98. |
| MLA | Chen, P,et al."Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO3 thin film grown on SrTiO3 substrate by laser molecular beam epitaxy".APPLIED SURFACE SCIENCE 137.1-4(1999):98. |
入库方式： OAI收割
来源：物理研究所
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