Application of energy-filtering transmission electron microscopy to characterize amorphous boron nanowires
文献类型:期刊论文
作者 | Wang, YQ ; Duan, XF ; Cao, LM ; Li, G ; Wang, WK |
刊名 | JOURNAL OF CRYSTAL GROWTH
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出版日期 | 2002 |
卷号 | 244期号:1页码:123 |
关键词 | ELEMENTAL DISTRIBUTION IMAGES IMAGING FILTER SILICON NANOWIRES LOSS SPECTROSCOPY LASER-ABLATION BIOLOGY SCIENCE SOLIDS CARBON WIRES |
ISSN号 | 0022-0248 |
通讯作者 | Wang, YQ: Univ Bristol, HH Wills Phys Lab, Tyndall Ave, Bristol BS8 1TL, Avon, England. |
中文摘要 | Well-aligned amorphous boron nanowires are prepared using magnetron sputtering. One type is straight without any branch and the other type is feather-like in morphology. Electron energy-loss spectroscopy has been used to detect the existence of oxygen in these boron nanowires. A Gatan imaging filter system, which is attached to a Philips CM200-field emission gun transmission electron microscope, has been used to acquire elemental mapping of boron and oxygen using inner-shell ionization edges. It is revealed that both the straight and feather-like boron nanowires possess the microstructure of the outer oxidized cover layer and inner pure boron. The thickness of the outer oxidized cover layer is about 1-2 nm. It can provide useful information for the growth mechanism of boron nanowires. (C) 2002 Elsevier Science B.V. All rights reserved. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-17 |
源URL | [http://ir.iphy.ac.cn/handle/311004/33923] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Wang, YQ,Duan, XF,Cao, LM,et al. Application of energy-filtering transmission electron microscopy to characterize amorphous boron nanowires[J]. JOURNAL OF CRYSTAL GROWTH,2002,244(1):123. |
APA | Wang, YQ,Duan, XF,Cao, LM,Li, G,&Wang, WK.(2002).Application of energy-filtering transmission electron microscopy to characterize amorphous boron nanowires.JOURNAL OF CRYSTAL GROWTH,244(1),123. |
MLA | Wang, YQ,et al."Application of energy-filtering transmission electron microscopy to characterize amorphous boron nanowires".JOURNAL OF CRYSTAL GROWTH 244.1(2002):123. |
入库方式: OAI收割
来源:物理研究所
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