中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Atomic scale study of strain relaxation in Sn islands on Sn-induced Si(111)-(2 root 3x2 root 3) surface

文献类型:期刊论文

作者Wang, LL ; Ma, XC ; Ning, YX ; Ji, SH ; Fu, YS ; Jia, JF ; Kelly, KF ; Xue, QK
刊名APPLIED PHYSICS LETTERS
出版日期2009
卷号94期号:15
关键词GROWTH PHASE
ISSN号0003-6951
通讯作者Wang, LL: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要Surface structure of the Sn islands 5 ML high, prepared on Si(111)-(2 root 3X2 root 3)-Sn substrate, is investigated by low temperature scanning tunneling microscopy/spectroscopy. Due to the elastic strain relaxation in the islands, the in-plane unit cell structure distorts and the apparent height of the surface atoms varies regularly to form an overall modulated strip structure. The quantum well states are observed to depend on the relative position within this structure, which implies the change of the surface chemical potential induced by the elastic strain relaxation as well.
收录类别SCI
资助信息National Science Foundation and Ministry of Science and Technology of China
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/34042]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Wang, LL,Ma, XC,Ning, YX,et al. Atomic scale study of strain relaxation in Sn islands on Sn-induced Si(111)-(2 root 3x2 root 3) surface[J]. APPLIED PHYSICS LETTERS,2009,94(15).
APA Wang, LL.,Ma, XC.,Ning, YX.,Ji, SH.,Fu, YS.,...&Xue, QK.(2009).Atomic scale study of strain relaxation in Sn islands on Sn-induced Si(111)-(2 root 3x2 root 3) surface.APPLIED PHYSICS LETTERS,94(15).
MLA Wang, LL,et al."Atomic scale study of strain relaxation in Sn islands on Sn-induced Si(111)-(2 root 3x2 root 3) surface".APPLIED PHYSICS LETTERS 94.15(2009).

入库方式: OAI收割

来源:物理研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。