Can the incident photo-to-electron conversion efficiency be used to calculate short-circuit current density of dye-sensitized solar cells
文献类型：期刊论文
| 作者 | Guo, XZ ; Luo, YH ; Li, CH ; Qin, D ; Li, DM ; Meng, QB |
| 刊名 | CURRENT APPLIED PHYSICS
 |
| 出版日期 | 2012 |
| 卷号 | 12页码:E54 |
| ISSN号 | 1567-1739 |
| 关键词 | PHOTOVOLTAIC CELLS DIFFUSION LENGTH BACK-REACTION THIN-FILMS TEMPERATURE FABRICATION DEPENDENCE INTENSITY INJECTION TICL4 |
| 通讯作者 | Meng, QB: Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | The relationship between the integration of the incident photo-to-electron conversion efficiency (IPCE) and the measured short-circuit current density (J(SC)) of dye-sensitized solar cell (DSC) has been analyzed. The J(SC) of DSC under full sun is usually considered to be determined by the overlap between its spectral IPCE and the spectral photon flux incident on the cell. However, the IPCE spectrum has been found to be influenced by the bias light intensity in many practical cases. Through theoretical deduction, we have proved that J(SC) calculated from IPCE spectrum is related to the slope at corresponding incident light intensity on the short-circuit photocurrent densityeincident light intensity (J(SC)-E-light) curve. The equal relation between J(SC) calculated from IPCE and J(SC) practically measured can only be obtained when the J(SC)-E-light curve is a straight line through the origin of the coordinates. The measured results of four DSC samples with different working condition show a good agreement with the theory. In addition, a simple method to validate the accuracy of IPCE measurement is also demonstrated. (C) 2011 Elsevier B.V. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/34461]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Guo, XZ,Luo, YH,Li, CH,et al. Can the incident photo-to-electron conversion efficiency be used to calculate short-circuit current density of dye-sensitized solar cells[J]. CURRENT APPLIED PHYSICS,2012,12:E54. |
| APA | Guo, XZ,Luo, YH,Li, CH,Qin, D,Li, DM,&Meng, QB.(2012).Can the incident photo-to-electron conversion efficiency be used to calculate short-circuit current density of dye-sensitized solar cells.CURRENT APPLIED PHYSICS,12,E54. |
| MLA | Guo, XZ,et al."Can the incident photo-to-electron conversion efficiency be used to calculate short-circuit current density of dye-sensitized solar cells".CURRENT APPLIED PHYSICS 12(2012):E54. |
入库方式： OAI收割
来源：物理研究所
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