CHARACTERIZATION OF GDBA2CU3O7-X SUPERCONDUCTING THIN-FILMS BY A NEW OPTICAL INTERFERENCE FRINGE METHOD
文献类型:期刊论文
作者 | MAI, ZH ; DAI, DY ; WANG, RL ; YI, HR ; WANG, CA ; Li, HC ; LU, TJ ; LI, L ; OGAWA, T |
刊名 | JOURNAL OF MATERIALS SCIENCE
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出版日期 | 1994 |
卷号 | 29期号:14页码:3702 |
关键词 | EPITAXIAL LAYERS SI WAFERS |
ISSN号 | 0022-2461 |
通讯作者 | MAI, ZH: CHINESE ACAD SCI,INST PHYS,BEIJING 100080,PEOPLES R CHINA. |
中文摘要 | GdBa2Cu3O7-x superconducting thin films, grown on yttrium-stabilized ZrO2 (YSZ) and LaAlO3 (LAO) substrates, were investigated by a new optical interference fringe method. The results show that (i) two sets of interference fringe pattern are observed on the samples grown on LAO substrates when the film thickness is less than 250 nm, one of them coming from the thin film and the other from the substrate; (ii) the fringe patterns vary slightly on different regions of the samples, which means that the perfection of the thin films is non-uniform; and (iii) defects such as grain boundaries and twin lamellae are observed in some samples. The relationship between the fringes and the degree of perfection of the sample is discussed according to the experimental results. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-17 |
源URL | [http://ir.iphy.ac.cn/handle/311004/34635] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | MAI, ZH,DAI, DY,WANG, RL,et al. CHARACTERIZATION OF GDBA2CU3O7-X SUPERCONDUCTING THIN-FILMS BY A NEW OPTICAL INTERFERENCE FRINGE METHOD[J]. JOURNAL OF MATERIALS SCIENCE,1994,29(14):3702. |
APA | MAI, ZH.,DAI, DY.,WANG, RL.,YI, HR.,WANG, CA.,...&OGAWA, T.(1994).CHARACTERIZATION OF GDBA2CU3O7-X SUPERCONDUCTING THIN-FILMS BY A NEW OPTICAL INTERFERENCE FRINGE METHOD.JOURNAL OF MATERIALS SCIENCE,29(14),3702. |
MLA | MAI, ZH,et al."CHARACTERIZATION OF GDBA2CU3O7-X SUPERCONDUCTING THIN-FILMS BY A NEW OPTICAL INTERFERENCE FRINGE METHOD".JOURNAL OF MATERIALS SCIENCE 29.14(1994):3702. |
入库方式: OAI收割
来源:物理研究所
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