中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy

文献类型:期刊论文

作者Gao, M ; Peng, LM ; Dong, XL ; Zhao, BR ; Liu, GD ; Zhao, ZX
刊名PHYSICAL REVIEW B
出版日期2000
卷号62期号:9页码:5413
关键词HIGH-TEMPERATURE SUPERCONDUCTORS INTERSTITIAL OXYGEN-ATOMS CHARGE-ORDERED STRIPES PHASE-SEPARATION TRANSITION TEMPERATURE SPIN FLUCTUATIONS LA2-XSRXCUO4 HOLES LA2NIO4+DELTA MODULATION
ISSN号0163-1829
通讯作者Gao, M: Chinese Acad Sci, Inst Phys, Electron Microscopy Lab, POB 603, Beijing 100080, Peoples R China.
中文摘要The techniques of transmission electron microscopy and electron energy loss spectroscopy (EELS) have been used for characterizing heavily Cu-doped polycrystalline La2CuO4.003 (LCO) samples. Semiquantitative and spatially resolved EELS analysis reveals that Cu may be doped into LCO lattice and that Cu doping introduces effectively holes into the sample. At room temperature, the LCO grains were found to phase separate into hole-poor and hole-rich grains, and in hole-rich grains holes were found to have a strong tendency to concentrate and form one-dimensional static ordering with planar domain wall promoted by high-energy electron beam. Two kinds of modulation vectors have been found, they are 1/4b* +/- 1/3c* (with a wavelength similar to 18.9 Angstrom) and 1/6a* +/- 1/3b* +/- 1/2c* (with a wavelength similar to 12.7 Angstrom). At lower temperatures, sharper and higher-order superlattice reflections were observed, indicating an enhanced charge ordering, and superlattice reflections originating from 1/4b* +/- 1/3c* were found to dominate those originating from 1/6a* +/- 1/3b* +/- 1/2c* with a shorter modulation period.
收录类别SCI
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/34636]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Gao, M,Peng, LM,Dong, XL,et al. Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy[J]. PHYSICAL REVIEW B,2000,62(9):5413.
APA Gao, M,Peng, LM,Dong, XL,Zhao, BR,Liu, GD,&Zhao, ZX.(2000).Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy.PHYSICAL REVIEW B,62(9),5413.
MLA Gao, M,et al."Characterization of heavily Cu-doped La2CuO4+delta by transmission electron microscopy and electron energy loss spectroscopy".PHYSICAL REVIEW B 62.9(2000):5413.

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来源:物理研究所

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