Characterization of Ti-Al-N films deposited by cathodic vacuum arc with different N-2 partial pressure
文献类型：期刊论文
| 作者 | Zhang, GP ; Wang, XQ ; Lv, GH ; Chen, H ; Pang, H ; Zhou, L ; Huang, J ; Chen, W ; Yang, SZ |
| 刊名 | APPLICATIONS OF ENGINEERING MATERIALS, PTS 1-4
 |
| 出版日期 | 2011 |
| 卷号 | 287-290页码:2429 |
| 关键词 | COATINGS (TI ORIENTATION HARDNESS AL)N |
| ISSN号 | 1022-6680 |
| 通讯作者 | Zhang, GP: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | Two-photon "ghost" imaging, based on the second-order intensity correlation, was first realized with entangled light, but has now been demonstrated with true thermal light. Following our work on lensless and high-order ghost imaging with thermal light, we have recently shown that both entangled and thermal light may be used to produce two-photon correlation Talbot effects. In the Talbot effect, first observed in 1836, a periodic object illuminated with coherent light can give rise to repeated self-images at specific positions within the Fresnel diffraction field without any lens. Using an incoherent thermal light source, we have experimentally observed second and higher order Talbot self-images, including fractional and phase-reversal images, at multiples of the Talbot length in a lensless setup containing two optical paths. We have also recently observed another surprising imaging phenomenon which does not depend on the second-order correlation function, and can produce both negative and positive images of a nonlocal object. It is expected that these types of imaging will find novel applications in both the microscopic and macroscopic regimes. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/34662]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Zhang, GP,Wang, XQ,Lv, GH,et al. Characterization of Ti-Al-N films deposited by cathodic vacuum arc with different N-2 partial pressure[J]. APPLICATIONS OF ENGINEERING MATERIALS, PTS 1-4,2011,287-290:2429. |
| APA | Zhang, GP.,Wang, XQ.,Lv, GH.,Chen, H.,Pang, H.,...&Yang, SZ.(2011).Characterization of Ti-Al-N films deposited by cathodic vacuum arc with different N-2 partial pressure.APPLICATIONS OF ENGINEERING MATERIALS, PTS 1-4,287-290,2429. |
| MLA | Zhang, GP,et al."Characterization of Ti-Al-N films deposited by cathodic vacuum arc with different N-2 partial pressure".APPLICATIONS OF ENGINEERING MATERIALS, PTS 1-4 287-290(2011):2429. |
入库方式： OAI收割
来源：物理研究所
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