Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM
文献类型：期刊论文
| 作者 | Wang, D ; Zou, J ; He, WZ ; Chen, H ; Li, FH ; Kawasaki, K ; Oikawa, T |
| 刊名 | ULTRAMICROSCOPY
 |
| 出版日期 | 2004 |
| 卷号 | 98期号:2-4页码:259 |
| 关键词 | RESOLUTION ELECTRON-MICROSCOPY SINGLE HETEROSTRUCTURES FOCUS-VARIATION BUFFER LAYER RECONSTRUCTION DENSITY STRAIN SI |
| ISSN号 | 0304-3991 |
| 通讯作者 | Li, FH: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | The core structure of a dislocation complex in SiGe/Si system composed of a perfect 60degrees dislocation and an extended 60 dislocation has been revealed at atomic level. This is attained by applying the image deconvolution technique in combination with dynamical diffraction effect correction to an image taken with a 200 kV field-emission high-resolution electron microscope. The possible configuration of the dislocation complex is analyzed and their Burgers vectors are determined. (C) 2003 Elsevier B.V. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/35817]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wang, D,Zou, J,He, WZ,et al. Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM[J]. ULTRAMICROSCOPY,2004,98(2-4):259. |
| APA | Wang, D.,Zou, J.,He, WZ.,Chen, H.,Li, FH.,...&Oikawa, T.(2004).Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM.ULTRAMICROSCOPY,98(2-4),259. |
| MLA | Wang, D,et al."Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM".ULTRAMICROSCOPY 98.2-4(2004):259. |
入库方式： OAI收割
来源：物理研究所
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