Distinguishing glide and shuffle types for 60 degrees dislocation in semicoductors by field-emission HREM image processing
文献类型：期刊论文
| 作者 | Wang, D ; Li, FH ; Zou, J |
| 刊名 | ULTRAMICROSCOPY
 |
| 出版日期 | 2000 |
| 卷号 | 85期号:3页码:131 |
| 关键词 | RESOLUTION ELECTRON-MICROSCOPY EXIT-WAVE RECONSTRUCTION PHASE-RETRIEVAL FOCUS-VARIATION DIFFRACTION DECONVOLUTION MICROGRAPHS CRYSTALS |
| ISSN号 | 0304-3991 |
| 通讯作者 | Li, FH: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | High-resolution electron microscope images were simulated for two structural models of Si crystal containing the 60 degrees dislocation of glide and shuffle types, respectively. The electron optical parameters for the image simulation were used by referring to a 200 kV field-emission high-resolution microscope. Since the contrast difference for the two types of dislocations is not significant enough for the eye to distinguish, it is impossible to determine the type of a dislocation from the image directly. Image reconstruction has been carried out by means of the image deconvolution technique. In the reconstructed images all atoms resolved individually and the two types of 60 degrees dislocations can be distinguished clearly. The effect and the limit of the method are discussed. (C) 2000 Elsevier Science B.V. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/36154]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wang, D,Li, FH,Zou, J. Distinguishing glide and shuffle types for 60 degrees dislocation in semicoductors by field-emission HREM image processing[J]. ULTRAMICROSCOPY,2000,85(3):131. |
| APA | Wang, D,Li, FH,&Zou, J.(2000).Distinguishing glide and shuffle types for 60 degrees dislocation in semicoductors by field-emission HREM image processing.ULTRAMICROSCOPY,85(3),131. |
| MLA | Wang, D,et al."Distinguishing glide and shuffle types for 60 degrees dislocation in semicoductors by field-emission HREM image processing".ULTRAMICROSCOPY 85.3(2000):131. |
入库方式： OAI收割
来源：物理研究所
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