Distorted surface topography observed by atomic force microscopy
文献类型：期刊论文
| 作者 | Li, LA ; Liu, RP ; Xu, Z ; Xu, Y ; Wang, WK ; Fan, CZ |
| 刊名 | MEASUREMENT
 |
| 出版日期 | 2006 |
| 卷号 | 39期号:1页码:12 |
| ISSN号 | 0263-2241 |
| 通讯作者 | Liu, RP: Yanshan Univ, Key Lab Metastable Mat Sci & Technol, Qinhuangdao, Peoples R China. |
| 中文摘要 | Topography of Au thin films deposited by magnetron sputtering technique on a silicon substrate was studied by atomic force microscopy (AFM). Distortion of the surface morphologies as a result of interaction between the film and the probe tip was observed. Some topographical morphologies that look like perfect were distorted, Thus, the reality of the topography by AFM, in some cases, needs to be re-evaluated. (C) 2005 Elsevier Ltd. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/36158]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Li, LA,Liu, RP,Xu, Z,et al. Distorted surface topography observed by atomic force microscopy[J]. MEASUREMENT,2006,39(1):12. |
| APA | Li, LA,Liu, RP,Xu, Z,Xu, Y,Wang, WK,&Fan, CZ.(2006).Distorted surface topography observed by atomic force microscopy.MEASUREMENT,39(1),12. |
| MLA | Li, LA,et al."Distorted surface topography observed by atomic force microscopy".MEASUREMENT 39.1(2006):12. |
入库方式： OAI收割
来源：物理研究所
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