Effects of interfacial Ru, Pd, Ag, and Au insertion layers on the anisotropic magnetoresistance in Ta/NiFe/Ta trilayers
文献类型：期刊论文
| 作者 | Xu, Y ; Cai, JW |
| 刊名 | ACTA PHYSICA SINICA
 |
| 出版日期 | 2011 |
| 卷号 | 60期号:11 |
| ISSN号 | 1000-3290 |
| 关键词 | SPIN-VALVE MULTILAYERS THIN-FILMS GIANT MAGNETORESISTANCE PERMALLOY THICKNESS NI81FE19 ELEMENTS PB |
| 通讯作者 | Cai, JW: Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | Ta/NiFe/Ta trilayers are commonly used in various commercial sensors based on anisotropic magnetoresistive(AMR) effect. Technologically it is desirable to reduce NiFe film thickness to diminish the demagnetization effect for the smaller and smaller devices. However, the AMR ratio of thin NiFe film decreases rapidly with film thickness decreasing when the NiFe film is thinner than 20 rim. Our previous work revealed that the AMR ratio and the thermal stability of Ta/NiFe/Ta trilayers can be significantly improved through interfacial Pt addition due to the enhanced interfacial spin-orbit scattering and the suppressed magnetic dead layers. In this paper, 4d and 5d elements including R.u, Pd, Ag and Au, are also introduced at the interfaces of Ta/NiFe/Ta films fabricated by DC magnetron sputtering. It is found that the insertion of interfacial Pd layers leads to an appreciable AMR enhancement in the as-sputtered state and after annealing. Insertion layers of Ag and Au with small surface energy and relatively low melting point suffer from thermal interdiffusion and seriously deteriorate the AMR of the annealed films, whereas Ru insertion layers exhibit improved thermal stability. The present results indicate that the AMR of Ta/NiFe/Ta films can be notably affected by the extremely thin interfacial insertion layers due to the changed interfacial spin-orbit scattering, magnetic dead layer and atomic interdiffusion. |
| 收录类别 | SCI |
| 语种 | 中文 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/36747]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Xu, Y,Cai, JW. Effects of interfacial Ru, Pd, Ag, and Au insertion layers on the anisotropic magnetoresistance in Ta/NiFe/Ta trilayers[J]. ACTA PHYSICA SINICA,2011,60(11). |
| APA | Xu, Y,&Cai, JW.(2011).Effects of interfacial Ru, Pd, Ag, and Au insertion layers on the anisotropic magnetoresistance in Ta/NiFe/Ta trilayers.ACTA PHYSICA SINICA,60(11). |
| MLA | Xu, Y,et al."Effects of interfacial Ru, Pd, Ag, and Au insertion layers on the anisotropic magnetoresistance in Ta/NiFe/Ta trilayers".ACTA PHYSICA SINICA 60.11(2011). |
入库方式： OAI收割
来源：物理研究所
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