Electroforming and endurance behavior of Al/Pr0.7Ca0.3MnO3/Pt devices
文献类型:期刊论文
作者 | Liao, ZL ; Gao, P ; Meng, Y ; Zhao, HW ; Bai, XD ; Zhang, JD ; Chen, DM |
刊名 | APPLIED PHYSICS LETTERS |
出版日期 | 2011 |
卷号 | 99期号:11 |
ISSN号 | 0003-6951 |
关键词 | OXIDE-FILMS RESISTANCE |
通讯作者 | Liao, ZL: Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
中文摘要 | We have investigated the electroforming (EF) and resistive switching (RS) of Al/Pr0.7Ca0.3MnO3 (PCMO)/Pt devices by using high-resolution transmission electron microscopy and x-ray photoelectron spectroscopy combined with transport measurement. The device prefers EF with positive bias with respect to Pt electrode and their endurance is enhanced with the chemically reactive Al electrode. The presence of an Al2O3-delta layer in Al/PCMO junction indicates that the oxidization and reduction near the Al/PCMO interface play a key role in the RS. (C) 2011 American Institute of Physics. [doi:10.1063/1.3638059] |
资助信息 | Chinese Academy of Sciences [KJCX2-SW-W26]; National Natural Science Foundation of China [90406017]; U.S. DOE [DOE DE-SC0002136] |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-17 |
源URL | [http://ir.iphy.ac.cn/handle/311004/37028] |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Liao, ZL,Gao, P,Meng, Y,et al. Electroforming and endurance behavior of Al/Pr0.7Ca0.3MnO3/Pt devices[J]. APPLIED PHYSICS LETTERS,2011,99(11). |
APA | Liao, ZL.,Gao, P.,Meng, Y.,Zhao, HW.,Bai, XD.,...&Chen, DM.(2011).Electroforming and endurance behavior of Al/Pr0.7Ca0.3MnO3/Pt devices.APPLIED PHYSICS LETTERS,99(11). |
MLA | Liao, ZL,et al."Electroforming and endurance behavior of Al/Pr0.7Ca0.3MnO3/Pt devices".APPLIED PHYSICS LETTERS 99.11(2011). |
入库方式: OAI收割
来源:物理研究所
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