Electron holography of barrier structures in Co/ZrAlOx/Co magnetic tunnel junctions
文献类型：期刊论文
| 作者 | Zhang, Z ; Zhu, T ; Shen, F ; Sheng, WT ; Wang, WG ; Xiao, JQ ; Zhang, Z |
| 刊名 | CHINESE PHYSICS LETTERS
 |
| 出版日期 | 2005 |
| 卷号 | 22期号:7页码:1732 |
| 关键词 | MAGNETORESISTANCE MICROSTRUCTURE TEMPERATURE MICROSCOPY FILMS AL |
| ISSN号 | 0256-307X |
| 通讯作者 | Zhang, Z: Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, Beijing 100080, Peoples R China. |
| 中文摘要 | We investigate the potential profiles and elemental distribution of barriers in Co/ZrAlOx/Co magnetic tunnel junctions (MTJs) using electron holography (EH) and scanning transmission electron microscopy. The MTJ barriers are introduced by oxidizing a bilayer consisting with a uniform 0.45-nm Al layer and a wedge-shaped Zr layer (0-2nm). From the scanning transmission electron microscopy, AlOx and ZrOx layers are mixed together, indicating that compact AlOx layer cannot be formed in such a bilayer structure of barriers. The EH results reveal that there are no sharp interfaces between the barrier and magnetic electrodes, which may be responsible for a smaller tunnelling magnetoresistance compared with the MTJs of Co/AlOx/Co. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/37092]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Zhang, Z,Zhu, T,Shen, F,et al. Electron holography of barrier structures in Co/ZrAlOx/Co magnetic tunnel junctions[J]. CHINESE PHYSICS LETTERS,2005,22(7):1732. |
| APA | Zhang, Z.,Zhu, T.,Shen, F.,Sheng, WT.,Wang, WG.,...&Zhang, Z.(2005).Electron holography of barrier structures in Co/ZrAlOx/Co magnetic tunnel junctions.CHINESE PHYSICS LETTERS,22(7),1732. |
| MLA | Zhang, Z,et al."Electron holography of barrier structures in Co/ZrAlOx/Co magnetic tunnel junctions".CHINESE PHYSICS LETTERS 22.7(2005):1732. |
入库方式： OAI收割
来源：物理研究所
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