Enhanced dielectric properties of Ba1-xSrxTiO3 thin film grown on La1-xSrxMnO3 bottom layer
文献类型：期刊论文
| 作者 | Miao, J ; Chen, WR ; Zhao, L ; Chen, B ; Yang, H ; Peng, W ; Zhu, XH ; Xu, B ; Cao, LX ; Qiu, XG ; Zhao, BR |
| 刊名 | JOURNAL OF APPLIED PHYSICS
 |
| 出版日期 | 2004 |
| 卷号 | 96期号:11页码:6578 |
| 关键词 | ELECTRICAL-PROPERTIES FERROELECTRIC PROPERTIES LANIO3 ELECTRODE LEAKAGE CURRENT HETEROSTRUCTURES OXYGEN LA0.5SR0.5COO3 TUNABILITY CAPACITORS DEPOSITION |
| ISSN号 | 0021-8979 |
| 通讯作者 | Zhao, BR: Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | The Ba0.7Sr0.3TiO3 (BST)/La0.67Sr0.33MnO3 (LSMO) heterostructure has been fabricated by pulsed-laser deposition on (001) SrTiO3 single crystal substrate. The crystallization and surface morphology of the heterostructure have been characterized by x-ray diffraction and atomic force microscopy. The composition distribution along the depth of the heterostructure is analyzed by Auger electron spectroscopy. It is founded that the LSMO bottom layer shows a marked effect on the dielectric properties of the BST films. Comparing with BST/YBCO (YBCO-YBa2Cu3O7) heterostructure grown by similar process, the dielectric loss exhibits much lower and less frequency dispersive, especially in the high frequency region. The loss tangent at 100 kHz is about 0.012 and the figure of merit factor is about 25 under the condition of 200 kV/cm. Ferroelectric hysteresis measurement shows that the remanent polarization and coercive field of the heterostructure are 3.4 muC/cm(2) and 39 kV/cm, respectively. These parameters are all better than BST/YBCO heterostructure. The good surface morphology and the element diffusion between BST and LSMO layers may be suggested to be responsible for the above-improved parameters of BST/LSMO heterostructure. (C) 2004 American Institute of Physics. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/37337]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Miao, J,Chen, WR,Zhao, L,et al. Enhanced dielectric properties of Ba1-xSrxTiO3 thin film grown on La1-xSrxMnO3 bottom layer[J]. JOURNAL OF APPLIED PHYSICS,2004,96(11):6578. |
| APA | Miao, J.,Chen, WR.,Zhao, L.,Chen, B.,Yang, H.,...&Zhao, BR.(2004).Enhanced dielectric properties of Ba1-xSrxTiO3 thin film grown on La1-xSrxMnO3 bottom layer.JOURNAL OF APPLIED PHYSICS,96(11),6578. |
| MLA | Miao, J,et al."Enhanced dielectric properties of Ba1-xSrxTiO3 thin film grown on La1-xSrxMnO3 bottom layer".JOURNAL OF APPLIED PHYSICS 96.11(2004):6578. |
入库方式： OAI收割
来源：物理研究所
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