中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Formation mechanism of amorphous layer at the interface of Si(111) substrate and AlN buffer layer for GaN

文献类型:期刊论文

作者Hu, GQ ; Kong, X ; Wang, YQ ; Wan, L ; Duan, XF ; Lu, Y ; Liu, XL
刊名JOURNAL OF MATERIALS SCIENCE LETTERS
出版日期2003
卷号22期号:22页码:1581
关键词MOLECULAR-BEAM EPITAXY HIGH-QUALITY GAN HETEROEPITAXIAL GROWTH HETEROSTRUCTURES
ISSN号0261-8028
通讯作者Hu, GQ: Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, POB 603, Beijing 100080, Peoples R China.
收录类别SCI
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/38372]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Hu, GQ,Kong, X,Wang, YQ,et al. Formation mechanism of amorphous layer at the interface of Si(111) substrate and AlN buffer layer for GaN[J]. JOURNAL OF MATERIALS SCIENCE LETTERS,2003,22(22):1581.
APA Hu, GQ.,Kong, X.,Wang, YQ.,Wan, L.,Duan, XF.,...&Liu, XL.(2003).Formation mechanism of amorphous layer at the interface of Si(111) substrate and AlN buffer layer for GaN.JOURNAL OF MATERIALS SCIENCE LETTERS,22(22),1581.
MLA Hu, GQ,et al."Formation mechanism of amorphous layer at the interface of Si(111) substrate and AlN buffer layer for GaN".JOURNAL OF MATERIALS SCIENCE LETTERS 22.22(2003):1581.

入库方式: OAI收割

来源:物理研究所

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