Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems
文献类型：期刊论文
| 作者 | Lin, X ; He, XB ; Lu, JL ; Gao, L ; Huan, Q ; Shi, DX ; Gao, HJ |
| 刊名 | CHINESE PHYSICS
 |
| 出版日期 | 2005 |
| 卷号 | 14期号:8页码:1536 |
| 关键词 | CARBON NANOTUBE TIPS CONDUCTANCE TRANSISTORS EMISSION |
| ISSN号 | 1009-1963 |
| 通讯作者 | Lin, X: Chinese Acad Sci, Inst Phys, Nanoscale Phys & Devices Lab, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV), which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM) and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to OAT), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/38451]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Lin, X,He, XB,Lu, JL,et al. Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems[J]. CHINESE PHYSICS,2005,14(8):1536. |
| APA | Lin, X.,He, XB.,Lu, JL.,Gao, L.,Huan, Q.,...&Gao, HJ.(2005).Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems.CHINESE PHYSICS,14(8),1536. |
| MLA | Lin, X,et al."Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems".CHINESE PHYSICS 14.8(2005):1536. |
入库方式： OAI收割
来源：物理研究所
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