HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis
文献类型：期刊论文
| 作者 | Peng, YP ; Nellist, PD ; Pennycook, SJ |
| 刊名 | JOURNAL OF ELECTRON MICROSCOPY
 |
| 出版日期 | 2004 |
| 卷号 | 53期号:3页码:257 |
| 关键词 | LATTICE-RESOLUTION CONTRAST COHERENT ELECTRON-PROBE DIFFRACTION SIMULATION CRYSTALS IMAGES SCATTERING MICROSCOPE SILICON ATOM |
| ISSN号 | 0022-0744 |
| 通讯作者 | Pennycook, SJ: Oak Ridge Natl Lab, Condensed Matter Sci Div, Oak Ridge, TN 37831 USA. |
| 中文摘要 | A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field image formation for sub-angstrom probes in scanning transmission electron microscopy (STEM). With increasing illumination angle, the contribution of the Is bound state increases to a maximum at an optimum probe angle, after which we find increasing contributions from high-angle plane wave states around the periphery of the objective aperture. Examination of image contributions from different depths within a crystal shows an oscillatory behavior due to the beating between Is and non-Is states. The oscillation period reduces with decreasing probe size, while the relative contribution from a specific depth increases. This signifies a changeover from a projection mode of imaging to a depth-slicing mode of imaging. This new mode appears capable of resolving three-dimensional atomic structures in future generation aberration-corrected STEM. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/39039]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Peng, YP,Nellist, PD,Pennycook, SJ. HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis[J]. JOURNAL OF ELECTRON MICROSCOPY,2004,53(3):257. |
| APA | Peng, YP,Nellist, PD,&Pennycook, SJ.(2004).HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.JOURNAL OF ELECTRON MICROSCOPY,53(3),257. |
| MLA | Peng, YP,et al."HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis".JOURNAL OF ELECTRON MICROSCOPY 53.3(2004):257. |
入库方式： OAI收割
来源：物理研究所
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