Heavy-fermion behavior in cerium-based metallic glasses
文献类型：期刊论文
| 作者 | Tang, MB ; Bai, HY ; Wang, WH ; Bogdanov, D ; Winzer, K ; Samwer, K ; Egami, T |
| 刊名 | PHYSICAL REVIEW B
 |
| 出版日期 | 2007 |
| 卷号 | 75期号:17 |
| ISSN号 | 1098-0121 |
| 中文摘要 | The defects in 3C-SiC film grown on (001) plane of Si substrate were studied using a 200 kV high-resolution electron microscope with point resolution of 0.2 nm. A posterior image processing technique, the image deconvolution, was utilized in combination with the image contrast analysis to distinguish atoms of Si from C distant from each other by 0.109 nm in the [110] projected image. The principle of the image processing technique utilized and the related image contrast theory is briefly presented. The procedures of transforming an experimental image that does not reflect the crystal structure intuitively into the structure map and of identifying Si and C atoms from the map are described. The atomic configurations for a 30 degrees partial dislocation and a microtwin have been derived at atomic level. It has been determined that the 30 degrees partial dislocation terminates in C atom and the segment of microtwin is sandwiched between two 180 degrees rotation twins. The corresponding stacking sequences are derived and atomic models are constructed according to the restored structure maps for both the 30 degrees partial dislocation and microtwin. Images were simulated based on the two models to affirm the above-mentioned results. |
| 收录类别 | SCI |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/39125]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Tang, MB,Bai, HY,Wang, WH,et al. Heavy-fermion behavior in cerium-based metallic glasses[J]. PHYSICAL REVIEW B,2007,75(17). |
| APA | Tang, MB.,Bai, HY.,Wang, WH.,Bogdanov, D.,Winzer, K.,...&Egami, T.(2007).Heavy-fermion behavior in cerium-based metallic glasses.PHYSICAL REVIEW B,75(17). |
| MLA | Tang, MB,et al."Heavy-fermion behavior in cerium-based metallic glasses".PHYSICAL REVIEW B 75.17(2007). |
入库方式： OAI收割
来源：物理研究所
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