HIGH-RESOLUTION SHADOW IMAGE SUPERIMPOSED ON LACBED PATTERNS - A METHOD DEMONSTRATED ON GEXSI1-X/SI SUPERLATTICE
文献类型：期刊论文
| 作者 | DUAN, XF |
| 刊名 | ULTRAMICROSCOPY
 |
| 出版日期 | 1992 |
| 卷号 | 41期号:1-3页码:249 |
| 关键词 | ELECTRON-DIFFRACTION ELASTIC RELAXATION EPITAXIAL LAYERS MULTILAYERS |
| ISSN号 | 0304-3991 |
| 通讯作者 | DUAN, XF: CHINESE ACAD SCI,BEIJING LAB ELECTRON MICROSCOPY,POB 2724,BEIJING 100080,PEOPLES R CHINA. |
| 中文摘要 | Large-angle convergent-beam electron diffraction patterns superimposed on a high-spatial-resolution shadow image of a cross-sectional specimen of the GexSi1-x/Si strained-layer superlattice has been obtained by using an electron beam with a rather small spot size in a Philips EM420 electron microscope working at 100 kV and room temperature. As an example, such a CBED shadow image can provide information about the changes in the lattice parameters, localized variations in strain, and the surface relaxation effect. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/39436]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | DUAN, XF. HIGH-RESOLUTION SHADOW IMAGE SUPERIMPOSED ON LACBED PATTERNS - A METHOD DEMONSTRATED ON GEXSI1-X/SI SUPERLATTICE[J]. ULTRAMICROSCOPY,1992,41(1-3):249. |
| APA | DUAN, XF.(1992).HIGH-RESOLUTION SHADOW IMAGE SUPERIMPOSED ON LACBED PATTERNS - A METHOD DEMONSTRATED ON GEXSI1-X/SI SUPERLATTICE.ULTRAMICROSCOPY,41(1-3),249. |
| MLA | DUAN, XF."HIGH-RESOLUTION SHADOW IMAGE SUPERIMPOSED ON LACBED PATTERNS - A METHOD DEMONSTRATED ON GEXSI1-X/SI SUPERLATTICE".ULTRAMICROSCOPY 41.1-3(1992):249. |
入库方式： OAI收割
来源：物理研究所
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