Image deconvolution for defected crystals in field-emission high-resolution electron microscopy
文献类型：期刊论文
| 作者 | He, WZ ; Li, FH ; Chen, H ; Kawasaki, K ; Oikawa, T |
| 刊名 | ULTRAMICROSCOPY
 |
| 出版日期 | 1997 |
| 卷号 | 70期号:1-2页码:1 |
| 关键词 | MICROGRAPHS ENHANCEMENT DIFFRACTION OBJECTS PATTERN FILTER FOCUS |
| ISSN号 | 0304-3991 |
| 通讯作者 | Li, FH: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | It is demonstrated that for images taken with a field-emission high-resolution electron microscope the image deconvolution based on the weak-phase object approximation is available for restoring the crystal defects with the resolution close to the information resolution limit. The image deconvolution is firstly carried out for simulated [110] images of perfect and defect Si crystal structure models with different thickness. The deconvoluted images reveal the atomic pairs as black dumbbells and show the correct atomic configuration including that at the twin boundary and near the 60 degrees dislocation core for the crystal thickness at least up to 76 Angstrom. An experimental [110] image of SiGe/Si has been restored to reveal an extended stacking fault sandwiched between two partial dislocations at the atomic level. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/39597]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | He, WZ,Li, FH,Chen, H,et al. Image deconvolution for defected crystals in field-emission high-resolution electron microscopy[J]. ULTRAMICROSCOPY,1997,70(1-2):1. |
| APA | He, WZ,Li, FH,Chen, H,Kawasaki, K,&Oikawa, T.(1997).Image deconvolution for defected crystals in field-emission high-resolution electron microscopy.ULTRAMICROSCOPY,70(1-2),1. |
| MLA | He, WZ,et al."Image deconvolution for defected crystals in field-emission high-resolution electron microscopy".ULTRAMICROSCOPY 70.1-2(1997):1. |
入库方式： OAI收割
来源：物理研究所
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