Image processing based on the combination of high-resolution electron microscopy and electron diffraction
文献类型：期刊论文
| 作者 | Li, FH |
| 刊名 | MICROSCOPY RESEARCH AND TECHNIQUE
 |
| 出版日期 | 1998 |
| 卷号 | 40期号:2页码:86 |
| 关键词 | ENTROPY MAXIMIZATION MODULATED STRUCTURES DECONVOLUTION RESTORATION MICROGRAPH |
| ISSN号 | 1059-910X |
| 通讯作者 | Li, FH: Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China. |
| 中文摘要 | A method of crystal structure determination by electron crystallographic image processing based on the combination of high-resolution electron microscopy (HREM) and electron diffraction is introduced. It consists of two stages: image deconvolution and resolution enhancement. In the first stage an image taken at an arbitrary defocus condition is transformed into the structure image-with the resolution depending on the resolution of the electron microscope. In the second stage the image resolution is enhanced to the diffraction resolution limit by combining the electron diffraction data and using the phase extension technique so that in the final image most unoverlapped atoms can be resolved individually. The experimental diffraction intensities are corrected for approximating to square structure factors. The principle of the image processing and the procedure of diffraction intensity correction are briefly described and the results of applications are illustrated. Since the method is based on the weak phase object approximation (WPOA), the validity of WPOA is discussed by introducing an approximate image contrast theory named pseudo weak phase object approximation (PWPOA) to demonstrate the image contrast change with the crystal thickness for very thin crystals. (C) 1998 Wiley-Liss, Inc. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/39606]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Li, FH. Image processing based on the combination of high-resolution electron microscopy and electron diffraction[J]. MICROSCOPY RESEARCH AND TECHNIQUE,1998,40(2):86. |
| APA | Li, FH.(1998).Image processing based on the combination of high-resolution electron microscopy and electron diffraction.MICROSCOPY RESEARCH AND TECHNIQUE,40(2),86. |
| MLA | Li, FH."Image processing based on the combination of high-resolution electron microscopy and electron diffraction".MICROSCOPY RESEARCH AND TECHNIQUE 40.2(1998):86. |
入库方式： OAI收割
来源：物理研究所
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