中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of dielectric loss on quality factors of photonic crystal microcavity modes

文献类型:期刊论文

作者Xiong, ZG ; Li, ZY ; Zhang, DZ
刊名CHINESE PHYSICS LETTERS
出版日期2008
卷号25期号:9页码:3292
关键词RESONANT FREQUENCIES PADE-APPROXIMATION CAVITIES SLABS COMPUTATION DESIGN FILMS ZNO
ISSN号0256-307X
通讯作者Xiong, ZG: Chinese Acad Sci, Inst Phys, Opt Phys Lab, Beijing Natl Lab Condensed Matter Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要We numerically investigate the quality factors of two-dimensional (2D) photonic crystal (PC) microcavities using an auxiliary differential equations (ADE) technique in the context of finite- difference time- domain (FDTD) method. The microcavities are formed by point defects in the air hole lattice hexagonally patterned in ZnO (zinc oxide) matrix. The quality factors of these microcavities are limited primarily by the absorption of the background dielectric. We show that the ratio between the quality factors of microcavities in lossy and lossless background dielectric depends on the overlap between the field of cavity modes and the absorbing background dielectric in addition to the magnitude of absorption. These results will be helpful when designing and optimizing photonic crystal microcavities formed in lossy medium.
收录类别SCI
资助信息National Natural Science Foundation of China [10525419, 60736041]; National Basic Research Programme of China [2006CB921702]
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/39803]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Xiong, ZG,Li, ZY,Zhang, DZ. Influence of dielectric loss on quality factors of photonic crystal microcavity modes[J]. CHINESE PHYSICS LETTERS,2008,25(9):3292.
APA Xiong, ZG,Li, ZY,&Zhang, DZ.(2008).Influence of dielectric loss on quality factors of photonic crystal microcavity modes.CHINESE PHYSICS LETTERS,25(9),3292.
MLA Xiong, ZG,et al."Influence of dielectric loss on quality factors of photonic crystal microcavity modes".CHINESE PHYSICS LETTERS 25.9(2008):3292.

入库方式: OAI收割

来源:物理研究所

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