Influence of dielectric loss on quality factors of photonic crystal microcavity modes
文献类型:期刊论文
作者 | Xiong, ZG ; Li, ZY ; Zhang, DZ |
刊名 | CHINESE PHYSICS LETTERS
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出版日期 | 2008 |
卷号 | 25期号:9页码:3292 |
关键词 | RESONANT FREQUENCIES PADE-APPROXIMATION CAVITIES SLABS COMPUTATION DESIGN FILMS ZNO |
ISSN号 | 0256-307X |
通讯作者 | Xiong, ZG: Chinese Acad Sci, Inst Phys, Opt Phys Lab, Beijing Natl Lab Condensed Matter Phys, POB 603, Beijing 100080, Peoples R China. |
中文摘要 | We numerically investigate the quality factors of two-dimensional (2D) photonic crystal (PC) microcavities using an auxiliary differential equations (ADE) technique in the context of finite- difference time- domain (FDTD) method. The microcavities are formed by point defects in the air hole lattice hexagonally patterned in ZnO (zinc oxide) matrix. The quality factors of these microcavities are limited primarily by the absorption of the background dielectric. We show that the ratio between the quality factors of microcavities in lossy and lossless background dielectric depends on the overlap between the field of cavity modes and the absorbing background dielectric in addition to the magnitude of absorption. These results will be helpful when designing and optimizing photonic crystal microcavities formed in lossy medium. |
收录类别 | SCI |
资助信息 | National Natural Science Foundation of China [10525419, 60736041]; National Basic Research Programme of China [2006CB921702] |
语种 | 英语 |
公开日期 | 2013-09-17 |
源URL | [http://ir.iphy.ac.cn/handle/311004/39803] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Xiong, ZG,Li, ZY,Zhang, DZ. Influence of dielectric loss on quality factors of photonic crystal microcavity modes[J]. CHINESE PHYSICS LETTERS,2008,25(9):3292. |
APA | Xiong, ZG,Li, ZY,&Zhang, DZ.(2008).Influence of dielectric loss on quality factors of photonic crystal microcavity modes.CHINESE PHYSICS LETTERS,25(9),3292. |
MLA | Xiong, ZG,et al."Influence of dielectric loss on quality factors of photonic crystal microcavity modes".CHINESE PHYSICS LETTERS 25.9(2008):3292. |
入库方式: OAI收割
来源:物理研究所
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