中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors

文献类型:期刊论文

作者Luan, CB ; Lin, ZJ ; Lv, YJ ; Meng, LG ; Yu, YX ; Cao, ZF ; Chen, H ; Wang, ZG
刊名APPLIED PHYSICS LETTERS
出版日期2012
卷号101期号:11
关键词MOBILITY
ISSN号0003-6951
通讯作者Lin, ZJ: Shandong Univ, Sch Phys, Jinan 250100, Peoples R China.
中文摘要With strong surface plasmons excited at the metallic tip, tip-enhanced Raman spectroscopy (TERS) has both high spectroscopic sensitivity and high spatial resolution, and is becoming an essential tool for chemical analysis. It is a great challenge to combine TERS with a high vacuum system due to the poor optical collection efficiency. We used our innovatively designed home-built high vacuum TERS (HV-TERS) to investigate the plasmon-driven in-situ chemical reaction of 4-nitrobenzenethiol dimerizing to dimercaptoazobenzene. The chemical reactions can be controlled by the plasmon intensity, which in turn can be controlled by the incident laser intensity, tunneling current and bias voltage. The temperature of such a chemical reaction can also be obtained by the clearly observed Stokes and Anti-Stokes HV-TERS peaks. Our findings offer a new way to design a highly efficient HV-TERS system and its applications to chemical catalysis and synthesis of molecules, and significantly extend the studies of chemical reactions.
收录类别SCI
资助信息National Natural Science Foundation of China [11174182, 10774090]; Specialized Research Fund for the Doctoral Program of Higher Education [20110131110005]
语种英语
公开日期2013-09-17
源URL[http://ir.iphy.ac.cn/handle/311004/39911]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Luan, CB,Lin, ZJ,Lv, YJ,et al. Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors[J]. APPLIED PHYSICS LETTERS,2012,101(11).
APA Luan, CB.,Lin, ZJ.,Lv, YJ.,Meng, LG.,Yu, YX.,...&Wang, ZG.(2012).Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors.APPLIED PHYSICS LETTERS,101(11).
MLA Luan, CB,et al."Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors".APPLIED PHYSICS LETTERS 101.11(2012).

入库方式: OAI收割

来源:物理研究所

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