INPLANE X-RAY-SCATTERING OF EPITAXIAL STRUCTURES
文献类型:期刊论文
作者 | CUI, SF ; WANG, YT ; ZHUANG, Y ; LI, M ; MAI, ZH |
刊名 | JOURNAL OF CRYSTAL GROWTH
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出版日期 | 1995 |
卷号 | 152期号:4页码:354 |
关键词 | STRAIN RELAXATION HETEROEPITAXIAL LAYERS DEVICE STRUCTURES ROCKING CURVES SUPERLATTICES DIFFRACTION HETEROSTRUCTURES MISFIT |
ISSN号 | 0022-0248 |
通讯作者 | CUI, SF: CHINESE ACAD SCI,INST PHYS,BEIJING 100080,PEOPLES R CHINA. |
中文摘要 | A new approach for in-plane X-ray scattering from the cleavages of epitaxial films or superlattices, where the scattering vectors are parallel to the interfaces, is proposed. This method can be employed to determine directly the in-plane X-ray strains and other atomic registry along the interfaces of the epitaxial structures. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-18 |
源URL | [http://ir.iphy.ac.cn/handle/311004/40024] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | CUI, SF,WANG, YT,ZHUANG, Y,et al. INPLANE X-RAY-SCATTERING OF EPITAXIAL STRUCTURES[J]. JOURNAL OF CRYSTAL GROWTH,1995,152(4):354. |
APA | CUI, SF,WANG, YT,ZHUANG, Y,LI, M,&MAI, ZH.(1995).INPLANE X-RAY-SCATTERING OF EPITAXIAL STRUCTURES.JOURNAL OF CRYSTAL GROWTH,152(4),354. |
MLA | CUI, SF,et al."INPLANE X-RAY-SCATTERING OF EPITAXIAL STRUCTURES".JOURNAL OF CRYSTAL GROWTH 152.4(1995):354. |
入库方式: OAI收割
来源:物理研究所
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