Investigation of Strain and Thin Film Relaxation in GexSi1-x/Si Strained-Layer Superlattice by Dark-Field Electron Holography
文献类型：期刊论文
| 作者 | Wang, ZF ; Yao, Y ; He, XQ ; Yang, Y ; Gu, L ; Wang, YG ; Duan, XF |
| 刊名 | MATERIALS TRANSACTIONS
 |
| 出版日期 | 2012 |
| 卷号 | 53期号:11页码:2019 |
| 关键词 | ELASTIC RELAXATION DIFFRACTION SPECIMENS |
| ISSN号 | 1345-9678 |
| 通讯作者 | Duan, XF: Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | Theory predicts, and experiments have shown, that dynamics is faster at glass surfaces than in the bulk, allowing the glass to settle into deeper energy landscape minima, or "age more." Is it possible that a glass surface could survive at temperatures where the bulk crystallizes, or that it could remain glassy after the bulk is heated all the way to its melting temperature and re-cooled? We image in real-time and with sub-nanometer resolution the two-state surface dynamics on a cerium-based glass surface, from deep within the glassy regime to above the crystallization temperature. Unlike other surfaces that we have studied, this glass surface remains amorphous even after the bulk re-crystallizes. The surface retains non-crystalline structure and two state dynamics of cooperatively rearranging regions even after heat annealing to just below the bulk melting temperature. The heat-annealed cooperatively rearranging regions are larger than originally, a sign that the surface is well aged. The surface dynamics depends weakly on temperature, showing no sign of the superexponential increase in bulk dynamics expected near T-g. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4757975] |
| 收录类别 | SCI |
| 资助信息 | Special Funds for Major State Basic Research Projects of the Ministry of Science and Technology of China [2007CB936301, 2010CB934200] |
| 语种 | 英语 |
| 公开日期 | 2013-09-18 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/40294]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wang, ZF,Yao, Y,He, XQ,et al. Investigation of Strain and Thin Film Relaxation in GexSi1-x/Si Strained-Layer Superlattice by Dark-Field Electron Holography[J]. MATERIALS TRANSACTIONS,2012,53(11):2019. |
| APA | Wang, ZF.,Yao, Y.,He, XQ.,Yang, Y.,Gu, L.,...&Duan, XF.(2012).Investigation of Strain and Thin Film Relaxation in GexSi1-x/Si Strained-Layer Superlattice by Dark-Field Electron Holography.MATERIALS TRANSACTIONS,53(11),2019. |
| MLA | Wang, ZF,et al."Investigation of Strain and Thin Film Relaxation in GexSi1-x/Si Strained-Layer Superlattice by Dark-Field Electron Holography".MATERIALS TRANSACTIONS 53.11(2012):2019. |
入库方式： OAI收割
来源：物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。